We report on qualitative and quantitative implications of the sample-tip interaction in piezoresponse force microscopy. Our finite-element analysis of adsorbate effects, sample heterogeneities, and tip asymmetries is in agreement with experimental observation of ferroelectric nanostructures. Qualitative discrepancies arise from locally asymmetric tip-sample interaction. Any quantitative determination of field-related material parameters as required for the verification of semiempirical models of the ferroelectric limit typically relies on an overestimated field across the sample. Our findings indicate that adsorbates reduce the actual field across the nanograin by roughly one order of magnitude
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
Here we study the piezoresponse of epitaxial ferroelectric samples excited through top electrode str...
Scanning Probe Microscopy (SPM) has emerged as an indispensable tool to probe and characterise mater...
Using BaTiO3 as a piezoelectric model system we compare a finite element model with experimental dat...
Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the elec...
In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytic...
Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation a...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
Piezoelectric force microscopy (PFM) has demonstrated to be a powerful tool to characterize ferroele...
Piezoresponse force-microscopy (PFM) has become the standard tool to investigate ferroelectrics on t...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of t...
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
Here we study the piezoresponse of epitaxial ferroelectric samples excited through top electrode str...
Scanning Probe Microscopy (SPM) has emerged as an indispensable tool to probe and characterise mater...
Using BaTiO3 as a piezoelectric model system we compare a finite element model with experimental dat...
Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the elec...
In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytic...
Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation a...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
The objective of this work is an evaluation of quantitative measurements of piezoresponse force micr...
Piezoelectric force microscopy (PFM) has demonstrated to be a powerful tool to characterize ferroele...
Piezoresponse force-microscopy (PFM) has become the standard tool to investigate ferroelectrics on t...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of t...
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
Here we study the piezoresponse of epitaxial ferroelectric samples excited through top electrode str...
Scanning Probe Microscopy (SPM) has emerged as an indispensable tool to probe and characterise mater...