Modelling at gigahertz frequencies is often based on (non)linear microwave/millimeter wave measurements. These measurements are usually considered ideal in modelling procedures. In this work, we demonstrate how measurement uncertainty may impact model extraction in two application areas: biofluidic modelling and large-signal transistor modelling.status: publishe
Model accuracy is a key consideration when using circuit simulation for microwave designs in general...
Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the ...
Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the ...
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral mod...
To support the responsible implementation of next-generation wireless communications networks such a...
We propagate the uncertainty of measurements used for the identification of a transistor nonlinear m...
We analyze the uncertainty contribution of the Nonlinear-Embedding design technique in transposing t...
We present an analysis of the propagation of measurement uncertainty in microwave transistor nonline...
We present an extended study on the uncertainty in resonant measurements. The uncertainty of the res...
We present an extended study on the uncertainty in resonant measurements. The uncertainty of the res...
We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National I...
International audienceThe measurement of the figures of merit (FOMs) of an advanced and miniaturized...
At millimetre wave frequencies, deembedding techniques start to fail due to larger uncertainty in me...
This paper discusses a procedure to extract large-signal models for microwave transistors. By using ...
The rapid growth of electronics and microsystem applications has always stimulated the semiconductor...
Model accuracy is a key consideration when using circuit simulation for microwave designs in general...
Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the ...
Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the ...
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral mod...
To support the responsible implementation of next-generation wireless communications networks such a...
We propagate the uncertainty of measurements used for the identification of a transistor nonlinear m...
We analyze the uncertainty contribution of the Nonlinear-Embedding design technique in transposing t...
We present an analysis of the propagation of measurement uncertainty in microwave transistor nonline...
We present an extended study on the uncertainty in resonant measurements. The uncertainty of the res...
We present an extended study on the uncertainty in resonant measurements. The uncertainty of the res...
We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National I...
International audienceThe measurement of the figures of merit (FOMs) of an advanced and miniaturized...
At millimetre wave frequencies, deembedding techniques start to fail due to larger uncertainty in me...
This paper discusses a procedure to extract large-signal models for microwave transistors. By using ...
The rapid growth of electronics and microsystem applications has always stimulated the semiconductor...
Model accuracy is a key consideration when using circuit simulation for microwave designs in general...
Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the ...
Large-signal modelling of electron devices for nonlinear MMIC design is a fundamental topic for the ...