Atomic force microscopes (AFMs) are capable of high-resolution mapping of structures and the measurement of mechanical properties on nanometre scales within gaseous, liquid and vacuum environments. The contact mode high-speed AFM (HS-AFM) developed at Bristol Nano Dynamics Ltd. operates at speeds that are orders of magnitude faster than conventional AFMs, and is capable of capturing multiple frames per second. This allows for direct observation of dynamic events in real-time, with nanometre lateral resolution and subatomic height resolution. HS-AFM is a valuable tool for the imaging of nanoscale corrosion initiation events, such as metastable pitting, grain boundary (GB) dissolution and short crack formation during stress corrosion cracking...
Preprint version of the open access article Merola, C., Cheng, H., Dworschak, D., Ku, C., Chiang, C....
Reactivity in confinement is central to a wide range of applications and systems, yet it is notoriou...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....
Atomic force microscopes (AFMs) are capable of high-resolution mapping of structures and the measure...
A Study of Dynamic Nanoscale Corrosion Initiation Events by HS-AFM Stacy Moore, Robert Burrows, Lore...
A Study of Dynamic Nanoscale Corrosion Initiation Events by HS-AFM Stacy Moore, Robert Burrows, Lore...
Generation of single corrosion pits and in situ monitoring of pit growth on iron exposed to 0.5 M Na...
In this thesis, both fundamental work and its applications will be presented. The course of the work...
In this thesis, both fundamental work and its applications will be presented. The course of the work...
Pitting corrosion has been studied for more than 5 decades by many different techniques, which have ...
Pitting corrosion has been studied for more than 5 decades by many different techniques, which have ...
Atomic force microscopy (PFM), invented in 1986, has found widespread use in science. The technique...
The combination of atomic force microscopy (AFM) and Kelvin probe force microscopy (KFM) was a power...
Multimodal nano-imaging in electrochemical environments is important across many areas of science an...
Multimodal nano-imaging in electrochemical environments is important across many areas of science an...
Preprint version of the open access article Merola, C., Cheng, H., Dworschak, D., Ku, C., Chiang, C....
Reactivity in confinement is central to a wide range of applications and systems, yet it is notoriou...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....
Atomic force microscopes (AFMs) are capable of high-resolution mapping of structures and the measure...
A Study of Dynamic Nanoscale Corrosion Initiation Events by HS-AFM Stacy Moore, Robert Burrows, Lore...
A Study of Dynamic Nanoscale Corrosion Initiation Events by HS-AFM Stacy Moore, Robert Burrows, Lore...
Generation of single corrosion pits and in situ monitoring of pit growth on iron exposed to 0.5 M Na...
In this thesis, both fundamental work and its applications will be presented. The course of the work...
In this thesis, both fundamental work and its applications will be presented. The course of the work...
Pitting corrosion has been studied for more than 5 decades by many different techniques, which have ...
Pitting corrosion has been studied for more than 5 decades by many different techniques, which have ...
Atomic force microscopy (PFM), invented in 1986, has found widespread use in science. The technique...
The combination of atomic force microscopy (AFM) and Kelvin probe force microscopy (KFM) was a power...
Multimodal nano-imaging in electrochemical environments is important across many areas of science an...
Multimodal nano-imaging in electrochemical environments is important across many areas of science an...
Preprint version of the open access article Merola, C., Cheng, H., Dworschak, D., Ku, C., Chiang, C....
Reactivity in confinement is central to a wide range of applications and systems, yet it is notoriou...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....