This paper describes the application of a new and easy to implement algorithm to EMI near-field scanning measurement results obtained with a time-domain-based measurement system. The algorithm aims to reduce the effect of spectral leakage on amplitude and phase of the measured field components. The proposed algorithm significantly increases the accuracy of the measured electromagnetic near field with a limited extra computational cost. The versatility and effectiveness of the proposed algorithm is shown on both simulated and measured data. It is shown that for situations with one single frequency component or with several well-separated frequency components, the algorithm is as performant as the application of a flat top window and outperfo...
This paper describes an automated sequential sampling algorithm for EMI near-field scanning of elect...
This paper describes an automated sequential sampling algorithm for EMI near-field scanning of elect...
Near-field scanning can be used to determine the far-field emissions of electronic devices. In gener...
This paper describes the application of a new and easy to implement algorithm to EMI near-field scan...
Time-domain near-field scanning is gaining more and more interest within EMC engineering to analyze ...
Near-field scanning has often been used to measure and characterize magnetic fields surrounding indi...
A procedure for the calibration and compensation of near-field scanning is described and demonstrate...
International audienceThis paper studies the effect of three important parameters in planar time-dom...
International audienceThis paper studies the effect of three important parameters in planar time-dom...
The evaluation of a product in terms of radiated emissions involves identifying the noise sources. S...
Electromagnetic (EM) emissions are a major issue for electronic products. Besides electronic product...
Electromagnetic (EM) emissions are a major issue for electronic products. Besides electronic product...
This paper describes two methods to cancel the effect of two kinds of leakage signals which may be p...
Electromagnetic (EM) emissions are a major issue for electronic products. Besides electronic product...
In this article, a method for representing electromagnetic emissions from a device under test (DUT) ...
This paper describes an automated sequential sampling algorithm for EMI near-field scanning of elect...
This paper describes an automated sequential sampling algorithm for EMI near-field scanning of elect...
Near-field scanning can be used to determine the far-field emissions of electronic devices. In gener...
This paper describes the application of a new and easy to implement algorithm to EMI near-field scan...
Time-domain near-field scanning is gaining more and more interest within EMC engineering to analyze ...
Near-field scanning has often been used to measure and characterize magnetic fields surrounding indi...
A procedure for the calibration and compensation of near-field scanning is described and demonstrate...
International audienceThis paper studies the effect of three important parameters in planar time-dom...
International audienceThis paper studies the effect of three important parameters in planar time-dom...
The evaluation of a product in terms of radiated emissions involves identifying the noise sources. S...
Electromagnetic (EM) emissions are a major issue for electronic products. Besides electronic product...
Electromagnetic (EM) emissions are a major issue for electronic products. Besides electronic product...
This paper describes two methods to cancel the effect of two kinds of leakage signals which may be p...
Electromagnetic (EM) emissions are a major issue for electronic products. Besides electronic product...
In this article, a method for representing electromagnetic emissions from a device under test (DUT) ...
This paper describes an automated sequential sampling algorithm for EMI near-field scanning of elect...
This paper describes an automated sequential sampling algorithm for EMI near-field scanning of elect...
Near-field scanning can be used to determine the far-field emissions of electronic devices. In gener...