We calculate the resistivity contribution of tilted grain boundaries with varying parameters in sub-10nm diameter metallic nanowires. The results have been obtained with the Boltzmann transport equation and Fermi’s golden rule, retrieving correct state-dependent relaxation times. The standard approximation schemes for the relaxation times are shown to fail when grain boundary tilt is considered. Grain boundaries tilted under the same angle or randomly tilted induce a resistivity decrease.status: publishe
Reiss G, Vancea J, Hoffmann H. Grain boundary resistance in polycrystalline metals. Physical review ...
Grain boundaries (GBs) in metals usually increase electrical resistivity due to their distinct atomi...
Metal and semiconductor nanowires (NWs) have been widely employed as the building blocks of the nano...
We calculate the resistivity contribution of tilted grain boundaries with varying parameters in sub-...
We study the resistivity scaling in nanometer-sized metallic wires due to surface roughness and grai...
The resistivity of metallic thin films and nanowires increases drastically when the film thickness o...
The resistivity of metallic thin films and nanowires increases drastically when the film thickness o...
A modeling approach, based on an analytical solution of the semiclassical multi-subband Boltzmann tr...
A self-consistent analytical solution of the multi-subband Boltzmann transport equation with collisi...
Artículo de publicación ISIThe resistivity of metallic structures depends on both electron-grain bou...
Artículo de publicación ISIWe calculate the electrical resistivity of a metallic specimen, under the...
Ando’s model provides a rigorous quantum mechanical framework for electron-surface roughness scatter...
It is well known that the conductivity of metal nanowires decreases with the wire diameter. This siz...
This chapter describes the role of grain boundaries and surfaces in the resistivity of metallic thin...
300-306A simple quantitative model has been proposed for exploring the combined effect of size, shap...
Reiss G, Vancea J, Hoffmann H. Grain boundary resistance in polycrystalline metals. Physical review ...
Grain boundaries (GBs) in metals usually increase electrical resistivity due to their distinct atomi...
Metal and semiconductor nanowires (NWs) have been widely employed as the building blocks of the nano...
We calculate the resistivity contribution of tilted grain boundaries with varying parameters in sub-...
We study the resistivity scaling in nanometer-sized metallic wires due to surface roughness and grai...
The resistivity of metallic thin films and nanowires increases drastically when the film thickness o...
The resistivity of metallic thin films and nanowires increases drastically when the film thickness o...
A modeling approach, based on an analytical solution of the semiclassical multi-subband Boltzmann tr...
A self-consistent analytical solution of the multi-subband Boltzmann transport equation with collisi...
Artículo de publicación ISIThe resistivity of metallic structures depends on both electron-grain bou...
Artículo de publicación ISIWe calculate the electrical resistivity of a metallic specimen, under the...
Ando’s model provides a rigorous quantum mechanical framework for electron-surface roughness scatter...
It is well known that the conductivity of metal nanowires decreases with the wire diameter. This siz...
This chapter describes the role of grain boundaries and surfaces in the resistivity of metallic thin...
300-306A simple quantitative model has been proposed for exploring the combined effect of size, shap...
Reiss G, Vancea J, Hoffmann H. Grain boundary resistance in polycrystalline metals. Physical review ...
Grain boundaries (GBs) in metals usually increase electrical resistivity due to their distinct atomi...
Metal and semiconductor nanowires (NWs) have been widely employed as the building blocks of the nano...