Analysis of Grain‐Boundary Impurities and Fluoride Additives in Hot‐Pressed Oxides by Auger Electron Spectroscopy

JOHNSON, W. C.
STEIN, D. F.
RICE, R. W.

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Publication date

January 1974

DOI

10.1111/j.1151-2916.1974.tb10918.x

Publisher

Wiley

Abstract

Auger electron spectroscopy was used to characterize grain‐boundary chemistry in MgO, Al2O3, and MgAl2O4 (spinel) hot‐pressed with LiF or NaF. The presence of additives (F, Na) at the grain boundaries was confirmed; observation of grain‐boundary impurities in MgO extends previous studies. Copyright © 1974, Wiley Blackwell. All rights reserve

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Analysis of Grain‐Boundary Impurities and Fluoride Additives in Hot‐Pressed Oxides by Auger Electron Spectroscopy

Abstract

Extracted data

Analysis of Grain‐Boundary Impurities and Fluoride Additives in Hot‐Pressed Oxides by Auger Electron Spectroscopy

Abstract

Extracted data

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