With the current aggressive integrated circuit technology scaling, vectorless power grid voltage integrity verification becomes key to designing reliable power delivery networks. To address the challenges of existing vectorless power grid verification methods that suffer from excessively long optimization time and poor scalability to large power grid designs, in this paper, we present a scalable multilevel vectorless power grid verification method which can efficiently tackle very large scale power grid verifications. By taking advantage of a series of coarsest to coarser grid verifications, the finest power grid verification can be accomplished in a more efficient way. To gain good efficiency, global and local \u27critical regions\u27 for ...
Verification of the chip power distribution network is a critical stepin modern IC design. Vectorles...
As part of integrated circuit design verification, one should check if the voltage drop on the power...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...
To deal with the growing phenomenon of electromigration (EM), power grid current integrity verificat...
Vectorless integrity verification is becoming increasingly critical to robust design of nanoscale po...
As technology scaling continues, the performance and reliability of integrated circuits become incre...
Abstract—Power grid verification has become an indispensable step to guarantee a functional and robu...
Vectorless power grid verification algorithms, by solving linear programming (LP) problems under cur...
Full-chip verification requires one to check if the power grid is safe, i.e., if the voltage drop on...
The verification of power grids in modern integrated circuits must start early in the design process...
This thesis develops a collection of computer-aided design (CAD) tools for analysis and verification...
Voltage drops are one of the most stringent problems in modern IC implementation, which is exacerbat...
Design verification must include the power grid. Checking that the voltage on the power grid does no...
As part of power distribution network verification, one should check if the voltage fluctuations exc...
Verification of the on-die power grid is a key step in the design of complex high performance integr...
Verification of the chip power distribution network is a critical stepin modern IC design. Vectorles...
As part of integrated circuit design verification, one should check if the voltage drop on the power...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...
To deal with the growing phenomenon of electromigration (EM), power grid current integrity verificat...
Vectorless integrity verification is becoming increasingly critical to robust design of nanoscale po...
As technology scaling continues, the performance and reliability of integrated circuits become incre...
Abstract—Power grid verification has become an indispensable step to guarantee a functional and robu...
Vectorless power grid verification algorithms, by solving linear programming (LP) problems under cur...
Full-chip verification requires one to check if the power grid is safe, i.e., if the voltage drop on...
The verification of power grids in modern integrated circuits must start early in the design process...
This thesis develops a collection of computer-aided design (CAD) tools for analysis and verification...
Voltage drops are one of the most stringent problems in modern IC implementation, which is exacerbat...
Design verification must include the power grid. Checking that the voltage on the power grid does no...
As part of power distribution network verification, one should check if the voltage fluctuations exc...
Verification of the on-die power grid is a key step in the design of complex high performance integr...
Verification of the chip power distribution network is a critical stepin modern IC design. Vectorles...
As part of integrated circuit design verification, one should check if the voltage drop on the power...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...