Multi-core architecture has emerged as the primary architectural choice to achieve power-efficient computing in microprocessors and SoCs. Power gating is indispensable for system power and thermal management and well suited for multi-core architectures. However, checking the power integrity (such as electromigration and voltage drop) of large gated power delivery networks (PDNs) presents a significant challenge due to the sheer die-package network complexity and the existence of an extremely large number of possible gating and operation configurations. We propose a simulation-based checking methodology that encompasses a comprehensive set of essential checking tasks. We tackle the challenges brought by the large checking space by developing...
Manufacturing defects that do not affect the functional operation of low power Integrated Circuits (...
Due to recent aggressive process scaling into the nanometer regime, power delivery network design fa...
Graduation date: 2015In recent years there have been many improvements in the reliability of critica...
This thesis develops a collection of computer-aided design (CAD) tools for analysis and verification...
Voltage drops are one of the most stringent problems in modern IC implementation, which is exacerbat...
System Level Power Management policies are typically based on moving the systemto various power mana...
Full-chip verification requires one to check if the power grid is safe, i.e., if the voltage drop on...
Abstract—Power gating is an effective technique for reducing leakage power which involves powering o...
System Level Power Management policies are typically based on moving the system to various power man...
To deal with the growing phenomenon of electromigration (EM), power grid current integrity verificat...
This paper proposes an efficient method to predict the worst case of voltage violation by multi-doma...
In order to decrease performance pessimism due to supply voltage uncertainties in integrated circuit...
Electromigration (EM) is a key reliability concern in chip power/ ground (p/g) grids, which has been...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...
Power networks supply power from the P/G pads on a chip to the circuit modules. With the rapid incre...
Manufacturing defects that do not affect the functional operation of low power Integrated Circuits (...
Due to recent aggressive process scaling into the nanometer regime, power delivery network design fa...
Graduation date: 2015In recent years there have been many improvements in the reliability of critica...
This thesis develops a collection of computer-aided design (CAD) tools for analysis and verification...
Voltage drops are one of the most stringent problems in modern IC implementation, which is exacerbat...
System Level Power Management policies are typically based on moving the systemto various power mana...
Full-chip verification requires one to check if the power grid is safe, i.e., if the voltage drop on...
Abstract—Power gating is an effective technique for reducing leakage power which involves powering o...
System Level Power Management policies are typically based on moving the system to various power man...
To deal with the growing phenomenon of electromigration (EM), power grid current integrity verificat...
This paper proposes an efficient method to predict the worst case of voltage violation by multi-doma...
In order to decrease performance pessimism due to supply voltage uncertainties in integrated circuit...
Electromigration (EM) is a key reliability concern in chip power/ ground (p/g) grids, which has been...
Power integrity has become a critical issue in nano-scale VLSI design. With technology scaling, the ...
Power networks supply power from the P/G pads on a chip to the circuit modules. With the rapid incre...
Manufacturing defects that do not affect the functional operation of low power Integrated Circuits (...
Due to recent aggressive process scaling into the nanometer regime, power delivery network design fa...
Graduation date: 2015In recent years there have been many improvements in the reliability of critica...