The positron two-dimensional angular correlation of annihilation radiation (2D-ACAR) technique has been coupled with optical excitation to study the native point defects in semi-insulating GaAs. The As vacancy was observed below ∼170 K when illuminated with 1.41±0.07 eV photons. The temperature dependence of the 2D-ACAR spectra, with and without illumination, was studied. Data were also collected at 25 K as a function of the intensity of infrared light. The 2D-ACAR spectra reflect the e+-e- pair momentum distribution at or near the vacancy and provides symmetry and electronic structure information, which can be used as a unique defect signature for the vacancy. © 1994 The American Physical Society
Recently a new semiconductor defect spectroscopy, namely positron deep level transient spectroscopy ...
Point defects in semiconductors can trap free charge carriers and localize excitons. The interaction...
We report on an attempt to observe the EL2 → EL2* transition in semi-insulating GaAs using Doppler b...
We describe the two dimensional angular correlation of positron annihilation radiation (2D-ACAR) met...
Abstract: We describe the two dimensional angular correlation of positron annihilation radiation (2D...
We describe how the nature of defects may be investigated by positron 2D-ACAR measurements. We show ...
We use positron annihilation to study vacancy defects in GaAs grown at low temperatures (LT-GaAs). T...
We report on the identification of native vacancies in GaAs by positron annihilation with a special ...
At a vacant lattice cell positron-ion repulsion is reduced leading to positron trapping. This causes...
Semi- insulating GaAs annealed at 1100 ° C at different arsenic pressures was investigated with the ...
Abstract: Positron Annihilation techniques have been used to investigate two important defects that ...
Variable energy positron annihilation measurements on as-grown and annealed GaAs grown by molecular ...
We have used positron annihilation spectroscopy to study the introduction of point defects in Zn-dif...
A summary of recent positron annihilation experiments on molecular beam epitaxy (MBE) grown III-V la...
The recent revived interest in the use of double-Doppler broadening of annihilation radiation (D-DBA...
Recently a new semiconductor defect spectroscopy, namely positron deep level transient spectroscopy ...
Point defects in semiconductors can trap free charge carriers and localize excitons. The interaction...
We report on an attempt to observe the EL2 → EL2* transition in semi-insulating GaAs using Doppler b...
We describe the two dimensional angular correlation of positron annihilation radiation (2D-ACAR) met...
Abstract: We describe the two dimensional angular correlation of positron annihilation radiation (2D...
We describe how the nature of defects may be investigated by positron 2D-ACAR measurements. We show ...
We use positron annihilation to study vacancy defects in GaAs grown at low temperatures (LT-GaAs). T...
We report on the identification of native vacancies in GaAs by positron annihilation with a special ...
At a vacant lattice cell positron-ion repulsion is reduced leading to positron trapping. This causes...
Semi- insulating GaAs annealed at 1100 ° C at different arsenic pressures was investigated with the ...
Abstract: Positron Annihilation techniques have been used to investigate two important defects that ...
Variable energy positron annihilation measurements on as-grown and annealed GaAs grown by molecular ...
We have used positron annihilation spectroscopy to study the introduction of point defects in Zn-dif...
A summary of recent positron annihilation experiments on molecular beam epitaxy (MBE) grown III-V la...
The recent revived interest in the use of double-Doppler broadening of annihilation radiation (D-DBA...
Recently a new semiconductor defect spectroscopy, namely positron deep level transient spectroscopy ...
Point defects in semiconductors can trap free charge carriers and localize excitons. The interaction...
We report on an attempt to observe the EL2 → EL2* transition in semi-insulating GaAs using Doppler b...