Add to ORKGA spectrophotometer, reflectometer, ellipsometer polarimeter or the like system having a detector means for independently intercepting electromagnetic radiation reflected from a sample frontside or backside, and methodology for pursuing less correlated determination of refractive index and thickness values
An innovative ellipsometer sample holder has been designed and tested in order to measure thin films...
Thesis (M.S.)--University of Rochester. College of Engineering and Applied Science. Institute of Opt...
A system for measuring an optical spectral response or property and/or IV data of a device or object...
A spectrophotometer, reflectometer, ellipsometer polarimeter or the like system having a detector me...
The measuring method has the light provided by a light source (1) passed through a rotating polarise...
The present invention is applicable generally to Spectroscopic Rotatable and Rotating Element Ellips...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
The index of refraction is a material property that determines the speed of light propagating throug...
A system and method of preventing substrate backside reflected components in a beam of electromagnet...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
A procedure for making A vs v plots to analyze ellipsometer readings was generated. This replaced th...
Methods and apparatus for assessing the size of a scattering element of a sample. Primary radiation ...
An ellipsoidal mirror reflectometer for measuring the reflectance of materials includes a source of ...
We report on a polarizing interferometer ellipsometer arrangement that overcomes the need for additi...
An innovative ellipsometer sample holder has been designed and tested in order to measure thin films...
Thesis (M.S.)--University of Rochester. College of Engineering and Applied Science. Institute of Opt...
A system for measuring an optical spectral response or property and/or IV data of a device or object...
A spectrophotometer, reflectometer, ellipsometer polarimeter or the like system having a detector me...
The measuring method has the light provided by a light source (1) passed through a rotating polarise...
The present invention is applicable generally to Spectroscopic Rotatable and Rotating Element Ellips...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
The index of refraction is a material property that determines the speed of light propagating throug...
A system and method of preventing substrate backside reflected components in a beam of electromagnet...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
A procedure for making A vs v plots to analyze ellipsometer readings was generated. This replaced th...
Methods and apparatus for assessing the size of a scattering element of a sample. Primary radiation ...
An ellipsoidal mirror reflectometer for measuring the reflectance of materials includes a source of ...
We report on a polarizing interferometer ellipsometer arrangement that overcomes the need for additi...
An innovative ellipsometer sample holder has been designed and tested in order to measure thin films...
Thesis (M.S.)--University of Rochester. College of Engineering and Applied Science. Institute of Opt...
A system for measuring an optical spectral response or property and/or IV data of a device or object...