Reliability has become one of the main issues for computing devices employed in several domains. This concern only deepens with the increase of integration in the same chip of several peripherals and accelerators. To evaluate computational system reliability, fault injection and radiation experiments are used. Fault injection in microarchitectural models of the processor provides deep insights on faults propagation through the entire system stack, including the operating system. Beam experiments, on the other hand, estimate the device’s expected soft error rate in realistic physical conditions by exposing it to the accelerated particle beam. Combining beam experiments and fault injection data can deliver deep insights about the device’s exp...
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs)...
Hardware errors become more common as silicon technologies shrink and become more vulnerable, especi...
Graphics Processing Units (GPUs) have moved from being dedicated devices for multi media and gaming ...
Extensive research efforts are being carried out to evaluate and improve the reliability of computin...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
Extensive research efforts are being carried out to evaluate and improve the reliability of computin...
Hoy día, existe una creciente demanda de las capacidades computacionales en sistemas críticos, donde...
Esta dissertação tem por finalidade apresentar uma metodologia de injeção de falhas baseada em emula...
Machine learning (ML) algorithms have provided straightforward solutions to a wide range of applicat...
The increasing computing capacity of multicore components like processors and graphics processing un...
The embedded processors operating in safety- or mission-critical systems are not allowed to fail. An...
HPC device’s reliability is one of the major concerns for supercomputers today and for the next gene...
Multicore electronic computing systems are incorporating more functionalities and new technologies i...
Recent technology advances have provided faster and smaller devices for manufacturing circuits that ...
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs)...
Hardware errors become more common as silicon technologies shrink and become more vulnerable, especi...
Graphics Processing Units (GPUs) have moved from being dedicated devices for multi media and gaming ...
Extensive research efforts are being carried out to evaluate and improve the reliability of computin...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
Extensive research efforts are being carried out to evaluate and improve the reliability of computin...
Hoy día, existe una creciente demanda de las capacidades computacionales en sistemas críticos, donde...
Esta dissertação tem por finalidade apresentar uma metodologia de injeção de falhas baseada em emula...
Machine learning (ML) algorithms have provided straightforward solutions to a wide range of applicat...
The increasing computing capacity of multicore components like processors and graphics processing un...
The embedded processors operating in safety- or mission-critical systems are not allowed to fail. An...
HPC device’s reliability is one of the major concerns for supercomputers today and for the next gene...
Multicore electronic computing systems are incorporating more functionalities and new technologies i...
Recent technology advances have provided faster and smaller devices for manufacturing circuits that ...
The main objective of this thesis is to develop analysis and mitigation techniques that can be used ...
This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs)...
Hardware errors become more common as silicon technologies shrink and become more vulnerable, especi...