A New Product Construction for the Diagnosability of Patterns in Time Petri Net
- Lubat, Éric
- Dal Zilio, Silvano
- Le Botlan, Didier
- Pencolé, Yannick
- Subias, Audine
Publication date
December 2020
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
International audienceWe propose a method to decide the diagnosability of patterns in labeled Time Petri nets (TPN) that gracefully extends a classic approach for the diagnosability of single faults. Our approach is based on a new technique for computing the language intersection of TPN and on an associated extension of the State Class Graph construction. Our approach has been implemented and we report on some experimental results
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