Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil
- Park, Junsik
- Lee, Jongsung
- Kim, Seongmoo
- Jo, Cheolgu
- Seol, Byongsu
- Kim, Jingook
Publication date
September 2016
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE) Journal
issn:0739-5159Abstract
The discharging currents through an IC induced by the charged board event (CBE) is measured using a shielded Rogowski coil. Several shielding techniques are applied in the measurement to reduce the common mode noise and the unexpected electric field coupling. The measured results are validated with the CBE circuit simulations
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