System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product
- Park, Junsik
- Lee, Jongsung
- Jo, Cheolgu
- Seol, Byongsu
- Kim, Jingook
Publication date
June 2017
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
The system-level ESD noises induced by a secondary discharge at voltage suppressor devices in a mobile product are measured and analyzed. Two kinds of voltage suppressor devices, voltage clamping-type and snapback-type devices, are characterized using TLP measurements. The voltage waveforms at the voltage suppressor devices and the power-ground decoupling capacitors are measured and analyzed according to several kinds of voltage suppressor devices
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