Investigation of laser annealing mechanisms in thin film coatings by photothermal microscopy

We study the evolution of the absorptance of amorphous metal oxide thin films when exposed to intense CW laser radiation measured using a photothermal microscope. The evolution of the absorptance is characterized by a nonexponential decay. Different models that incorporate linear and nonlinear absorption, free carrier absorption, and defect diffusion are used to fit the results, with constraints imposed on the fit parameters to scale with power and intensity. The model that best fits is that two types of interband defects are passivated independently, one by a one-photon process and the other one by a two-photon process.Fil: Zaldivar Escola, Facundo. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Mingolo, Nélida. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; ArgentinaFil: Martínez, Oscar E.. Universidad de Buenos Aires. Facultad de Ingeniería. Departamento de Física; ArgentinaFil: Rocca, Jorge J.. State University of Colorado - Fort Collins; Estados UnidosFil: Menoni, Carmen S.. State University of Colorado - Fort Collins; Estados Unido