Direct force measurements between oppositely charged latex particles in aqueous electrolyte solutions were carried out with a multiparticle colloidal probe technique based on atomic force microscopy. Force profiles between two dissimilarly charged surfaces can be only described when charge regulation effects are taken into account, while constant charge or constant potential boundary conditions are inappropriate. Surface potentials and regulation parameters are determined from force data obtained in symmetric systems with the Poisson-Boltzmann theory and constant regulation approximation. The resulting quantities are used to predict the force profiles in asymmetric systems, and good agreement between theory and experiment is found. These fi...
The present article provides an overview of the recent progress in the direct force measurements bet...
Interaction forces between ionizable surfaces across an electrolyte solution on the Poisson−Boltzman...
AbstractThe atomic force microscope (AFM) is sensitive to electric double layer interactions in elec...
We show how the colloidal-probe technique, which is based on force measurements made with the atomic...
Force measurements between three types of latex particles of diameters down to 1 μm with sulfate and...
In this article, a compilation of resul ts on direct force measurements between colloidal particles ...
Charge regulation in the electrical double layer has important implications for ion adsorption, inte...
Force profiles as well as aggregation and deposition rates are studied for asymmetrically charged pa...
Forces between positively and negatively charged colloidal particles across aqueous salt solutions c...
Direct force measurements between negatively charged silica microparticles are carried out in suspen...
Direct force measurements between negatively charged silica particles in the presence of a like-char...
Forces between positively and negatively charged colloidal particles across aqueous salt solutions c...
The aim of this study was to measure interaction forces between surfaces with high electric potentia...
Forces between charged silica particles in solutions of multivalent coions are measured with colloid...
We analyze the interaction forces between charged surfaces across aqueous solutions under the condit...
The present article provides an overview of the recent progress in the direct force measurements bet...
Interaction forces between ionizable surfaces across an electrolyte solution on the Poisson−Boltzman...
AbstractThe atomic force microscope (AFM) is sensitive to electric double layer interactions in elec...
We show how the colloidal-probe technique, which is based on force measurements made with the atomic...
Force measurements between three types of latex particles of diameters down to 1 μm with sulfate and...
In this article, a compilation of resul ts on direct force measurements between colloidal particles ...
Charge regulation in the electrical double layer has important implications for ion adsorption, inte...
Force profiles as well as aggregation and deposition rates are studied for asymmetrically charged pa...
Forces between positively and negatively charged colloidal particles across aqueous salt solutions c...
Direct force measurements between negatively charged silica microparticles are carried out in suspen...
Direct force measurements between negatively charged silica particles in the presence of a like-char...
Forces between positively and negatively charged colloidal particles across aqueous salt solutions c...
The aim of this study was to measure interaction forces between surfaces with high electric potentia...
Forces between charged silica particles in solutions of multivalent coions are measured with colloid...
We analyze the interaction forces between charged surfaces across aqueous solutions under the condit...
The present article provides an overview of the recent progress in the direct force measurements bet...
Interaction forces between ionizable surfaces across an electrolyte solution on the Poisson−Boltzman...
AbstractThe atomic force microscope (AFM) is sensitive to electric double layer interactions in elec...