A nano-handling technique based on atomic force microscopy (AFM) is presented that allows reliable measuring of force–extension profiles of single-polymer molecules. The basis of the method is a properly functionalized solid substrate, to which a small amount of the polymers in question is adsorbed. The sample is first imaged in amplitude modulation mode in solution with a functionalized AFM cantilever, and a polymer chain is picked up with the AFM tip at one of the ends of the polymer molecule. Force curves are recorded by stretching the attached polymer molecule many times. After the force experiments, the molecule is imaged again. In this fashion, one can ascertain that the force experiments are truly carried out with one individual mole...
Polymers have dominated materials technology over the last century and remain a major field despite ...
Abstract With the rapid development of polymer materials, the simultaneous acquisition of micro‐nano...
In this work we apply a force modulation technique to a standard atomic force microscope (AFM) in or...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
In this thesis, the physical properties of dendronized polymers (DPs) were investigated by means of ...
In this thesis, the physical properties of dendronized polymers (DPs) were investigated by means of ...
Adhesion and mechanics of dendronized polymers at single-molecule level GREBIKOVA, Lucie In this the...
We have directly measured the entropic elasticity due to the uncoiling of individual polymer chains ...
We have directly measured the entropic elasticity due to the uncoiling of individual polymer chains ...
We have directly measured the entropic elasticity due to the uncoiling of individual polymer chains ...
In this work we apply a force modulation technique to a standard atomic force microscope (AFM) in or...
This contribution reviews selected mechanical experiments on individual flexible macromolecules usin...
We present here the measurement of the single-polymer entropic elasticity and the single covalent bo...
Polymers have dominated materials technology over the last century and remain a major field despite ...
Polymers have dominated materials technology over the last century and remain a major field despite ...
Abstract With the rapid development of polymer materials, the simultaneous acquisition of micro‐nano...
In this work we apply a force modulation technique to a standard atomic force microscope (AFM) in or...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
The present article offers an overview on the use of atomic force microscopy (AFM) to characterize t...
In this thesis, the physical properties of dendronized polymers (DPs) were investigated by means of ...
In this thesis, the physical properties of dendronized polymers (DPs) were investigated by means of ...
Adhesion and mechanics of dendronized polymers at single-molecule level GREBIKOVA, Lucie In this the...
We have directly measured the entropic elasticity due to the uncoiling of individual polymer chains ...
We have directly measured the entropic elasticity due to the uncoiling of individual polymer chains ...
We have directly measured the entropic elasticity due to the uncoiling of individual polymer chains ...
In this work we apply a force modulation technique to a standard atomic force microscope (AFM) in or...
This contribution reviews selected mechanical experiments on individual flexible macromolecules usin...
We present here the measurement of the single-polymer entropic elasticity and the single covalent bo...
Polymers have dominated materials technology over the last century and remain a major field despite ...
Polymers have dominated materials technology over the last century and remain a major field despite ...
Abstract With the rapid development of polymer materials, the simultaneous acquisition of micro‐nano...
In this work we apply a force modulation technique to a standard atomic force microscope (AFM) in or...