As traditional silicon technology is moving fast towards its fundamental limits, all-oxide electronics is emerging as a challenger offering principally different electronic behavior and switching mechanisms. This technology can be utilized to fabricate devices with enhanced and exotic functionality. One of the challenges for integration of complex oxides in electronics is the availability of appreciable low-temperature synthesis routes. Herein we provide a fundamental extension of the materials toolbox for oxide electronics by reporting a facile route for deposition of highly electrically conductive thin films of LaNiO3 by atomic layer deposition at low temperatures. The films grow epitaxial on SrTiO3 and LaAlO3 as deposited at 225 °C, with...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
LaLuO3 thin films have been deposited with atomic layer deposition on Si substrates using beta-diket...
We report on the analysis of weak localization observed in epitaxial films of LaNiO3-delta deposited...
Designing complex oxides with appreciable low-temperature synthesis remains a challenge. Here, the a...
Oxide materials exhibit a wide range of functional properties, such as isolators, superconductors, f...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
We report on the analysis of weak localization observed in epitaxial films of LaNiO3-δ deposited coh...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
LaLuO3 thin films have been deposited with atomic layer deposition on Si substrates using beta-diket...
We report on the analysis of weak localization observed in epitaxial films of LaNiO3-delta deposited...
Designing complex oxides with appreciable low-temperature synthesis remains a challenge. Here, the a...
Oxide materials exhibit a wide range of functional properties, such as isolators, superconductors, f...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
LaNiO3 thin films were deposited on SrLaAlO4 (1 0 0) and SrLaAlO4 (0 0 1) single crystal substrates ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
We report on the analysis of weak localization observed in epitaxial films of LaNiO3-δ deposited coh...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
International audienceWe report on the analysis of weak localization observed in epitaxial films of ...
LaLuO3 thin films have been deposited with atomic layer deposition on Si substrates using beta-diket...
We report on the analysis of weak localization observed in epitaxial films of LaNiO3-delta deposited...