Motivated by recent developments in laser-induced spallation testing of thin film structures, we develop a spectral scheme for the simulation of dynamic failure of thin films. In this first study, we focus on the anti-plane shear (mode 3) loading case. The scheme relies on an exact spectral representation of the elastodynamic solutions in the substrate and in the film, and their combination through interface conditions that involve general cohesive failure and/or frictional contact models. A detailed modal analysis of the response of a single spectral mode is performed to assess the stability and precision of the resulting numerical scheme. A set of dynamic fracture problems involving non-propagating and propagating cracks are simulated to ...
Thin film adhesion often determines microelectronic device reliability and it is therefore essential...
We present a numerical formulation for three-dimensional elastodynamic problems of fracture on plana...
textDifferent fracture modes have been observed in thin film structures. One common approach used in...
We present a spectral scheme specially developed to simulate the delamination of thin films subjecte...
We present here a novel experimental/numerical protocol to extract the fracture toughness of the thi...
We present here a novel experimental/numerical protocol to extract the fracture toughness of the thi...
The conventional approach to analysis of thin film delamination is based on the consideration of the...
The conventional approach to analysis of thin film delamination is based on the consideration of the...
The conventional approach to analysis of thin film delamination is based on the consideration of the...
100 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A more complete description o...
100 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A more complete description o...
ABSTRACT—A new test method is developed for studying mixed-mode interfacial failure of thin films us...
Adhesive failure and the attendant delamination of a thin film on a substrate is controlled by the f...
A novel dynamic adhesion test is being developed to extract quantitative fracture parameters using l...
textDifferent fracture modes have been observed in thin film structures. One common approach used in...
Thin film adhesion often determines microelectronic device reliability and it is therefore essential...
We present a numerical formulation for three-dimensional elastodynamic problems of fracture on plana...
textDifferent fracture modes have been observed in thin film structures. One common approach used in...
We present a spectral scheme specially developed to simulate the delamination of thin films subjecte...
We present here a novel experimental/numerical protocol to extract the fracture toughness of the thi...
We present here a novel experimental/numerical protocol to extract the fracture toughness of the thi...
The conventional approach to analysis of thin film delamination is based on the consideration of the...
The conventional approach to analysis of thin film delamination is based on the consideration of the...
The conventional approach to analysis of thin film delamination is based on the consideration of the...
100 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A more complete description o...
100 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.A more complete description o...
ABSTRACT—A new test method is developed for studying mixed-mode interfacial failure of thin films us...
Adhesive failure and the attendant delamination of a thin film on a substrate is controlled by the f...
A novel dynamic adhesion test is being developed to extract quantitative fracture parameters using l...
textDifferent fracture modes have been observed in thin film structures. One common approach used in...
Thin film adhesion often determines microelectronic device reliability and it is therefore essential...
We present a numerical formulation for three-dimensional elastodynamic problems of fracture on plana...
textDifferent fracture modes have been observed in thin film structures. One common approach used in...