In this paper we discuss the potential applicability of SOI MOS transistors with non-doped (or intrinsic) channels for analog applications. We present the comparison of doped and intrinsic nMOSFETs in terms of parameters of the importance for analog designers and demonstrate that intrinsic devices are very prom ising for low-voltage, low-power analog applications, as they feature better threshold voltage control and predictability, higher maximum transconductance, driving current and attenuation of floating body effects. We show that the use of non-doped devices gives the opportunity to create fully-depleted (FD) devices within a partially-depleted (PD) process. A new effect occurring in such intrinsic devices, which we call "PD-to-FD jump"...
Abstract. This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology off...
In this paper the analog performance of Graded-Channel (GC) SOI nMOSFETs with deep submicrometer cha...
We present in this work is an analysis of die low temperature operation of Graded-Channel fully-depl...
In this work we discuss the potential applicability of SOI MOS transistors with non-doped channels f...
This work presents a systematic comparative study of the influence of various process options on the...
In this paper, we study the potential of SOI MOSFETs with non-doped (or intrinsic) channels. We demo...
Figures-of-merit of non-standard channel engineered devices are presented. We put emphasis on effect...
Although the reduction of parasitic capacitance and the feasibility of diffusion resistors and capac...
This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology offers unique...
This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology offers unique...
Transistor models which reproduce the superior device characteristics of fully depleted siliconon- i...
This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology offers unique...
An extended study of analog circuit design using Graded-Channel Silicon-On-Insulator MOSFETs in comp...
An extended study of analog circuit design using graded-channel (GC) silicon-on-insulator (SOI) MOSF...
An extended study of analog circuit design using graded-channel (GC) silicon-on-insulator (SOI) MOSF...
Abstract. This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology off...
In this paper the analog performance of Graded-Channel (GC) SOI nMOSFETs with deep submicrometer cha...
We present in this work is an analysis of die low temperature operation of Graded-Channel fully-depl...
In this work we discuss the potential applicability of SOI MOS transistors with non-doped channels f...
This work presents a systematic comparative study of the influence of various process options on the...
In this paper, we study the potential of SOI MOSFETs with non-doped (or intrinsic) channels. We demo...
Figures-of-merit of non-standard channel engineered devices are presented. We put emphasis on effect...
Although the reduction of parasitic capacitance and the feasibility of diffusion resistors and capac...
This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology offers unique...
This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology offers unique...
Transistor models which reproduce the superior device characteristics of fully depleted siliconon- i...
This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology offers unique...
An extended study of analog circuit design using Graded-Channel Silicon-On-Insulator MOSFETs in comp...
An extended study of analog circuit design using graded-channel (GC) silicon-on-insulator (SOI) MOSF...
An extended study of analog circuit design using graded-channel (GC) silicon-on-insulator (SOI) MOSF...
Abstract. This paper demonstrates that fully-depleted (FD) silicon-on-insulator (SOI) technology off...
In this paper the analog performance of Graded-Channel (GC) SOI nMOSFETs with deep submicrometer cha...
We present in this work is an analysis of die low temperature operation of Graded-Channel fully-depl...