Probing the organization of adsorbed protein layers: Complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling
- Dufrêne, Yves
- Marchal, T.G.
- Rouxhet, Paul
- 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis
DOIAbstract
Atomic force microscopy (AFM) has been used to investigate the organization of the collagen layer present on polymer substrata after adsorption and drying, while the adsorbed amount was monitored using X-ray photoelectron spectroscopy (XPS) and radiochemical measurements. Differences in the organization of the adsorbed collagen layer (surface coverage, layer thickness) observed by AFM fitted well with those found by models obtained from XPS and radiolabeling data. (C) 1999 Elsevier Science B.V. All rights reserved
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