Observing magnetic nanowires by means of magnetic force microscopy

Magnetic force microscopy (MFM) is being used to image [Co/Cu].N and pure Co nanowires with diameters in the 80-90 nm range. Symmetry considerations as well as a close inspection of defects in the magnetic sequence allow for detailed conclusions to be reached. Although necessarily resting on a highest likelihood basis, the latter are substantiated by a simple model excluding altogether perturbations of the: magnetization distribution within tip or sample. Crystallographic features are revealed indirectly as well as finely spaced antiferromagnetic type magnetic sequences. It is believed that the present observations reveal for the first time the coexistence of axially and transversally magnetized segments within a given nanowire. Lastly, it is shown from an instrumental point of view that topographic and magnetic imaging are intimately interwoven. (C) 1998 Elsevier Science B.V. All rights reserved