Perpendicular magnetoresistance in Co/Cu multilayered nanowires

We have carried out magnetoresistance measurements in the CPP (current perpendicular to the planes) geometry of electrodeposited Co/Cu multilayered nanowires with Cu and Co layer thicknesses varying over wide ranges. The data are compared with the results of the Valet-Fert model for perpendicular transport. The observed behaviour agrees with the corresponding predictions in various limits of the layers thicknesses. The interface and bulk spin-dependent scattering parameters as well as the spin diffusion lengths in the nonmagnetic and ferromagnetic layers are extracted from this analysis