The model describes correctly the drain current and the small signal parameters in all regions of operation, including the subthreshold regime and the saturation regime. The model contains as an approximation the charge-sheet model proposed b Brews (see ibid., vol.21, p.345, 1978). Mobility variations along the channel, resulting from the normal and lateral electric fields, can be taken into account.Anglai
Substrate current is a good indicator for the hot-carrier and electrostatic discharge related reliab...
Substrate current is a good indicator for the hot-carrier and electrostatic discharge related reliab...
A new analytical large signal non-quasi-static model is derived for short-channel MOSFETs. Existing ...
Texto completo. Acesso restrito. p. 1945-1952This paper presents a long-channel MOSFET model wherein...
In this paper we provide an insight into the drain current model for long-channel MOSFET devices. A ...
A simple semiempirical model I[subscript D](V[subscript GS], V[subscript DS]) for short-channel MOSF...
This paper presents a new piecewise-linear de model of the MOSFET. The proposed model is derived for...
Abstract—We discuss and develop a compact MOSFET modeling scheme in order to obtain accurate descrip...
731-737An analytic model for saturation drain current and substrate current of fully overlapped lig...
This paper presents a new and more accurate potential based model for bulk MOSFET compared to the tr...
Based upon a common charge-sheet approach analytical models of the drain current and the capacitance...
The accuracy of the existing metal-oxide-semiconductor-field-effect-transistor (MOSFET) models used ...
A model of the drain current in the long-gate JFET and MESFET is proposed in which the electron velo...
A charge-based model is presented for long-channel cylindrical surrounding-gate (SRG) MOSFETs from a...
ABSTRACT:-In this paper, a simple general yet realistic MOSFET model named n th power law MOSFET mod...
Substrate current is a good indicator for the hot-carrier and electrostatic discharge related reliab...
Substrate current is a good indicator for the hot-carrier and electrostatic discharge related reliab...
A new analytical large signal non-quasi-static model is derived for short-channel MOSFETs. Existing ...
Texto completo. Acesso restrito. p. 1945-1952This paper presents a long-channel MOSFET model wherein...
In this paper we provide an insight into the drain current model for long-channel MOSFET devices. A ...
A simple semiempirical model I[subscript D](V[subscript GS], V[subscript DS]) for short-channel MOSF...
This paper presents a new piecewise-linear de model of the MOSFET. The proposed model is derived for...
Abstract—We discuss and develop a compact MOSFET modeling scheme in order to obtain accurate descrip...
731-737An analytic model for saturation drain current and substrate current of fully overlapped lig...
This paper presents a new and more accurate potential based model for bulk MOSFET compared to the tr...
Based upon a common charge-sheet approach analytical models of the drain current and the capacitance...
The accuracy of the existing metal-oxide-semiconductor-field-effect-transistor (MOSFET) models used ...
A model of the drain current in the long-gate JFET and MESFET is proposed in which the electron velo...
A charge-based model is presented for long-channel cylindrical surrounding-gate (SRG) MOSFETs from a...
ABSTRACT:-In this paper, a simple general yet realistic MOSFET model named n th power law MOSFET mod...
Substrate current is a good indicator for the hot-carrier and electrostatic discharge related reliab...
Substrate current is a good indicator for the hot-carrier and electrostatic discharge related reliab...
A new analytical large signal non-quasi-static model is derived for short-channel MOSFETs. Existing ...