We present a new fully self-aligned single-electron memory with a single pair of nano floating gates, made of different materials (Si and Ge). The energy barrier that prevents stored charge leakage is induced not only by quantum effects but also by the conduction-band offset that arises between Ge and Si. The dimensions and position of each floating gate are well-defined and controlled. The devices exhibit a long retention time and single-electron injection at room temperature
Tunnel oxide thickness scaling is encountering problem for next generation flash memory device. With...
Self-aligned single-dot memory devices and arrays were fabricated based on arsenic-assisted etching ...
We demonstrate storage of electrons in semiconductor nanowires epitaxially grown from Au nanoparticl...
We present a new fully self-aligned single-electron memory with a single pair of nano floating gates...
This paper reviews the main achievements towards the realization of memories where the information i...
This paper proposes a novel single-electron multiple-valued memory. It is a metal-oxide-semiconducto...
Сharge trapping in self-aligned single-dot memory devices fabricated by UCL technology based on arse...
Charge trapping in self-aligned single-dot memory devices fabricated by UCL technology based on arse...
This paper investigates the charge trapping mechanism and electrical performance of CdSe nanocrystal...
This thesis research is focussed on the development of strongly coupled single-charge devices. Singl...
One of the most promising applications of single-electronics is a single-electron memory chip. Such ...
We investigate the memory function at room temperature in devices based on quantum dots. By Low Pres...
Considerable research efforts have been devoted to promoting memory performance, especially the memo...
Abstract—The Ge/Si hetero-nanocrystal as a floating gate has been discussed and improved. The charge...
[[abstract]]A novel gate-all-around (GAA) poly-Si floating-gate (FG) memory device with triangular n...
Tunnel oxide thickness scaling is encountering problem for next generation flash memory device. With...
Self-aligned single-dot memory devices and arrays were fabricated based on arsenic-assisted etching ...
We demonstrate storage of electrons in semiconductor nanowires epitaxially grown from Au nanoparticl...
We present a new fully self-aligned single-electron memory with a single pair of nano floating gates...
This paper reviews the main achievements towards the realization of memories where the information i...
This paper proposes a novel single-electron multiple-valued memory. It is a metal-oxide-semiconducto...
Сharge trapping in self-aligned single-dot memory devices fabricated by UCL technology based on arse...
Charge trapping in self-aligned single-dot memory devices fabricated by UCL technology based on arse...
This paper investigates the charge trapping mechanism and electrical performance of CdSe nanocrystal...
This thesis research is focussed on the development of strongly coupled single-charge devices. Singl...
One of the most promising applications of single-electronics is a single-electron memory chip. Such ...
We investigate the memory function at room temperature in devices based on quantum dots. By Low Pres...
Considerable research efforts have been devoted to promoting memory performance, especially the memo...
Abstract—The Ge/Si hetero-nanocrystal as a floating gate has been discussed and improved. The charge...
[[abstract]]A novel gate-all-around (GAA) poly-Si floating-gate (FG) memory device with triangular n...
Tunnel oxide thickness scaling is encountering problem for next generation flash memory device. With...
Self-aligned single-dot memory devices and arrays were fabricated based on arsenic-assisted etching ...
We demonstrate storage of electrons in semiconductor nanowires epitaxially grown from Au nanoparticl...