This fundamental contribution on time-of-flight secondary ion mass spectrometry polymer depth-profiling by massive argon clusters is focused on the investigation of the influence of the Ar cluster size and the molecular weight of the investigated polymers on the efficiency of the sputtering process. For this purpose, 100-nm thin films of polymethylmethacrylate and polystyrene, with a range of molecular weights (103–1.5 × 105amu) spin-coated onto Si wafers, are sputtered by 10 keV Arn + cluster ions with selected sizes (1500, 3000 and 5000 atoms/cluster) employing Bi5 + as an analysis source. The experiments show that the sputtering yield volume (nm3/primary ion), Y, decreases with the increase of the molecular weight, Mw, for a selected clu...
Argon gas cluster ion beams (Ar-GCIBs) provide new opportunities for molecular depth profiling and i...
19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Jeju, SOUTH KOREA, SEP 29-O...
Secondary ion mass spectrometry (SIMS) is a well-known surface analysis technique with numerous appl...
This fundamental contribution on secondary ion mass spectrometry (SIMS) polymer depth-profiling by l...
International audienceIn this work, we investigate the influence of the molecular weight of poly (me...
Surface and thin films are important in modern technologies and there is growing demand for their ch...
In this work, time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to study the intens...
International audienceTime-of-flight secondary ion mass spectrometry (ToF-SIMS) is a high performanc...
This article reviews the results of molecular dynamics simulations of cluster sputtering of hydrocar...
This article reviews the results of molecular dynamics simulations of cluster sputtering of hydrocar...
In this work, the authors examine chemical stability of polymers under x-ray photoemission spectrosc...
This article reports the latest developments of our theoretical studies of gas cluster bombardment o...
Argon gas cluster ion beams (Ar-GCIBs) are remarkable new projectiles for secondary ion mass spectro...
This molecular dynamics study focuses on the relationships between the sputtered volume and the crat...
Argon clusters are increasingly used for organic mass spectrometry and 3D imaging, but their interac...
Argon gas cluster ion beams (Ar-GCIBs) provide new opportunities for molecular depth profiling and i...
19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Jeju, SOUTH KOREA, SEP 29-O...
Secondary ion mass spectrometry (SIMS) is a well-known surface analysis technique with numerous appl...
This fundamental contribution on secondary ion mass spectrometry (SIMS) polymer depth-profiling by l...
International audienceIn this work, we investigate the influence of the molecular weight of poly (me...
Surface and thin films are important in modern technologies and there is growing demand for their ch...
In this work, time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to study the intens...
International audienceTime-of-flight secondary ion mass spectrometry (ToF-SIMS) is a high performanc...
This article reviews the results of molecular dynamics simulations of cluster sputtering of hydrocar...
This article reviews the results of molecular dynamics simulations of cluster sputtering of hydrocar...
In this work, the authors examine chemical stability of polymers under x-ray photoemission spectrosc...
This article reports the latest developments of our theoretical studies of gas cluster bombardment o...
Argon gas cluster ion beams (Ar-GCIBs) are remarkable new projectiles for secondary ion mass spectro...
This molecular dynamics study focuses on the relationships between the sputtered volume and the crat...
Argon clusters are increasingly used for organic mass spectrometry and 3D imaging, but their interac...
Argon gas cluster ion beams (Ar-GCIBs) provide new opportunities for molecular depth profiling and i...
19th International Conference on Secondary Ion Mass Spectrometry (SIMS), Jeju, SOUTH KOREA, SEP 29-O...
Secondary ion mass spectrometry (SIMS) is a well-known surface analysis technique with numerous appl...