It is well known that high temperature thermal aging can increase the thickness of the IMC layer of a solder joint and, consequently, the mechanical strength of the solder joint is reduced. Yet there is still no conclusive explanation that can answer the question why the growth of IMC layer can reduce the strength of solder joints. In this study, the fracture energies of the Cu-Sn IMC layer after various periods of thermal aging were compared using the impact test method. Detailed fractographic analysis was also performed. In addition, the brittle failure of solder joints under high speed ball pull tests was analyzed for comparison. © 2012 IEEE
Power cycle reliability of solder joints with Sn-5Sb (mass%) and Sn-10Sb (mass%) alloys was investig...
At the interface between Sn-based solders and substrates, intermetallic compounds (IMCs) form and gr...
Lead-free solders have replaced tin-lead solders in electronic products due to European Union laws o...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
Tensile testing was carried out at constant cross-head speed of 0.5 mm/min on specimens of two Cu bl...
620 ℃ thermal aging was carried out on full Cu3Sn solder joints for various duration, the microstruc...
The most frequent failure of wireless, handheld, and movable consumer electronic products is an acci...
This study reports the effect of different types of thermo-mechanical excursion (TME) on growth of i...
Tensile properties and stress-controlled fatigue fracture behaviors of Cu/Sn-4Ag solder joints aged ...
Cu6Sn5 and Cu3Sn are common intermetallic compounds (IMCs) found in Sn-Ag-Cu (SAC) lead-free solder ...
In this study, 96.5 Sn-3.0 Ag-0.5 Cu solder balls were joined to Au/Ni-P/Cu pads by a thermal reflow...
The interlayers at solder/pad interface are critical to the reliability of solder joints; hence, the...
Solder joints in thermally uncontrolled microelectronic assemblies have to be exposed to extreme tem...
This work utilizes the lap shear test to investigate the shear strength and fracture behaviour of el...
This study aims to investigate the shear and tensile impact strength of solder ball attachments. Tes...
Power cycle reliability of solder joints with Sn-5Sb (mass%) and Sn-10Sb (mass%) alloys was investig...
At the interface between Sn-based solders and substrates, intermetallic compounds (IMCs) form and gr...
Lead-free solders have replaced tin-lead solders in electronic products due to European Union laws o...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
Tensile testing was carried out at constant cross-head speed of 0.5 mm/min on specimens of two Cu bl...
620 ℃ thermal aging was carried out on full Cu3Sn solder joints for various duration, the microstruc...
The most frequent failure of wireless, handheld, and movable consumer electronic products is an acci...
This study reports the effect of different types of thermo-mechanical excursion (TME) on growth of i...
Tensile properties and stress-controlled fatigue fracture behaviors of Cu/Sn-4Ag solder joints aged ...
Cu6Sn5 and Cu3Sn are common intermetallic compounds (IMCs) found in Sn-Ag-Cu (SAC) lead-free solder ...
In this study, 96.5 Sn-3.0 Ag-0.5 Cu solder balls were joined to Au/Ni-P/Cu pads by a thermal reflow...
The interlayers at solder/pad interface are critical to the reliability of solder joints; hence, the...
Solder joints in thermally uncontrolled microelectronic assemblies have to be exposed to extreme tem...
This work utilizes the lap shear test to investigate the shear strength and fracture behaviour of el...
This study aims to investigate the shear and tensile impact strength of solder ball attachments. Tes...
Power cycle reliability of solder joints with Sn-5Sb (mass%) and Sn-10Sb (mass%) alloys was investig...
At the interface between Sn-based solders and substrates, intermetallic compounds (IMCs) form and gr...
Lead-free solders have replaced tin-lead solders in electronic products due to European Union laws o...