Elastic constants of an epilayer usually differ from that of its substrate. The effect of this difference on the critical thickness of an epilayer is investigated via isotropic elasticity. The results indicate that the self-energy of a mismatch dislocation is controlled by the soft phase between the epilayer and the substrate. while the interaction energy depends only on the elastic constants of the thin film. It is easier for a dislocation to be formed if the substrate is softer than the film, and consequently the critical thickness is smaller. On the other hand, a soft epilayer can be very thick without any mismatch dislocation
The properties and the performance of epitaxial semiconductor thin films depend on the stress-state ...
This process was considered theoretically. By using elasticity theory, the corresponding critical th...
The study of dislocations in multi layered structures is important as a means of understanding the m...
The critical thickness of an epilayer on a substrate with different elastic constants is investigate...
The critical thickness of an epilayer on a substrate with different elastic constants is investigate...
The critical thickness of an epilayer on a substrate with different elastic constants is investigate...
[[abstract]]The effect of substrate modulus difference on dislocation formation in an epitaxial film...
The present work studies the critical thickness of an epilayer on a substrate with a finite or infin...
The critical thickness of an epilayer on a compliant substrate with the semiconductor-on-insulator c...
[[abstract]]The system of an epitaxial film on a semi-infinite substrate of a different material is ...
Based on the dislocation theory of twinning, an analytical solution is given to determine the critic...
The critical epilayer thickness for the formation of misfit dislocations at the interface between an...
The role of the free surface in determining the equilibrium position of misfit dislocations in thin ...
thermal stress in single crystal thin films on a rigid substrate are used to study size effects. The...
The continuum theory of elastic dislocations is applied to estimate the critical thickness of a stra...
The properties and the performance of epitaxial semiconductor thin films depend on the stress-state ...
This process was considered theoretically. By using elasticity theory, the corresponding critical th...
The study of dislocations in multi layered structures is important as a means of understanding the m...
The critical thickness of an epilayer on a substrate with different elastic constants is investigate...
The critical thickness of an epilayer on a substrate with different elastic constants is investigate...
The critical thickness of an epilayer on a substrate with different elastic constants is investigate...
[[abstract]]The effect of substrate modulus difference on dislocation formation in an epitaxial film...
The present work studies the critical thickness of an epilayer on a substrate with a finite or infin...
The critical thickness of an epilayer on a compliant substrate with the semiconductor-on-insulator c...
[[abstract]]The system of an epitaxial film on a semi-infinite substrate of a different material is ...
Based on the dislocation theory of twinning, an analytical solution is given to determine the critic...
The critical epilayer thickness for the formation of misfit dislocations at the interface between an...
The role of the free surface in determining the equilibrium position of misfit dislocations in thin ...
thermal stress in single crystal thin films on a rigid substrate are used to study size effects. The...
The continuum theory of elastic dislocations is applied to estimate the critical thickness of a stra...
The properties and the performance of epitaxial semiconductor thin films depend on the stress-state ...
This process was considered theoretically. By using elasticity theory, the corresponding critical th...
The study of dislocations in multi layered structures is important as a means of understanding the m...