Investigations into Electronic Stopping Regime Sputtering of Uranium Tetrafluoride

Yields were measured for 235U sputtered from UF4 by 16O, 19F, and 35Cl over the energy range ~.12 to 1.5 MeV/ amu sing a charge equilibrated beam in the stripped beam arrangement for all the incident ions and in the transmission arrangement for 19F and 35Cl. In addition, yields were measured for 19F incident in a wide range of discrete charge states. The angular dependence of all the measured yields were consistent with cosʋ. The stripped beam and transmission data were well fit by the form (Az2eqln(BƐ)/Ɛ)4 (where Ɛ was the ion energy in MeV/amu and zeq(Ɛ) was taken from Zeigler (80). The fitted values of B for the various sets of data were consistent with a constant B0, equal to 36.3 ± 2.7, independent of incident ion. The fitted values of A show no consistent variation with incident ion although a difference can be noted between the stripped beam and transmission values, the transmission values being higher. The incident charge data were well fit by the assumptions that the sputtering yield depended locally on a power of the incident ion charge and that the sputtering from the surface is exponentially correlated to conditions in the bulk. The equilibrated sputtering yields derived from these data are in agreement with the stripped beam yields. In addition, to aid in the understanding of these data, the data of Hakansson (80,81a,81b) were examined and contrasted with the UF4 results. The thermal models of Seiberling (80) and Watson (81) were discussed and compared to the data.