Single-Event Latch-Up (SEL) Automatic Detection and Recovery for the RT6804-1 Battery Stack Monitor

From previous SEE testing on the RT6804-11, a soft latch-up condition was identified with this device. When exposed to heavy ions, the RT6804-1’s supply current can increase from the typical 12mA to 30mA or higher. This condition can be corrected by pulling all of the cell pins to GND. ADI wanted to provide an application circuit that automatically detects and corrects this SEL condition using minimal external components. This paper describes the mitigation circuit operation and SEE test results