Spectral X‐ray computed micro tomography : 3‐dimensional chemical imaging

We present a new approach to 3-dimensional chemical imaging based on X-ray computed micro tomography (CT), which enables the analysis of the internal elemental chemistry. The method uses a conventional laboratory-based CT scanner equipped with a semiconductor detector (CdTe). Based on the X-ray absorption spectra, elements in a sample can be distinguished by their specific K-edge energy. The capabilities and performance of this new approach are illustrated with different experiments, i.e. single pure element particle measurements, element differentiation in mixtures, and mineral differentiation in a natural rock sample. The results show that the method can distinguish elements with K-edges in the range of 20 to 160 keV, this corresponds to an element range from Ag to U. Furthermore, the spectral information allows a distinction between materials, which show little variation in contrast in the reconstructed CT image