Mask-guided sample selection for semi-supervised instance segmentation

The final publication is available at Springer via http://dx.doi.org/10.1007/s11042-020-09235-4Image segmentation methods are usually trained with pixel-level annotations, which require significant human effort to collect. Weakly-supervised pipelines are the most common solution to address this constraint because they are trained with lower forms of supervision, such as bounding boxes or scribbles. Semi-supervised methods are another option, that leverage a large amount of unlabeled data and a limited number of strongly-labeled samples. In this second setup, samples to be strongly-annotated can be selected randomly or with an active learning mechanism that chooses the ones that will maximize the model performance. In this work, we propose a sample selection approach to decide which samples to annotate for semi-supervised instance segmentation. Our method consists in first predicting pseudo-masks for the unlabeled pool of samples, together with a score predicting the quality of each mask. This score is an estimate of the Intersection Over Union (IoU) of the segment with the ground truth mask. We study which samples should be annotated based on the quality score, leading to an improved performance for semi-supervised instance segmentation with low annotation budgets.This work was partially supported by the Spanish Ministry of Economy and Competitivity under contracts TIN2012-34557 by the BSC-CNS Severo Ochoa program (SEV-2011-00067), and contracts TEC2013-43935-R and TEC2016-75976-R. It has also been supported by grants 2014-SGR-1051 and 2014-SGR-1421 by the Government of Catalonia, and the European Regional Development Fund (ERDF). We would also like to acknowledge the valuable discussions with Victor Campos.Peer ReviewedPostprint (published version