International audienceThe paper presents the impact of lighting type and direction on measurements of surface asperities using focus-variation microscopy. Particular attention was paid to the direction of lighting when using a light ring. It was pointed out that the lighting direction directly affects the values of the parameters Rt, Rz, and Rc. The article also presents the impact of a light polarizer on the surface topography parameters. It has been shown that the positioning of a sample with a regular and directed structure relative to the optical axis of the light polarizer affects the accuracy of mapping surface asperities. The largest differences were observed for Rz and Rt parameters. A method of using an external polarizer mounted o...
In coaxial illumination telecentric imaging optical systems such as microscopes and imaging cameras,...
Non-measured points (NMPs) are one of vital problems in optical measurement. The number and location...
Unlike the optical information taken from a single in-focus image of general optical microscopy, thr...
International audienceThe paper presents the impact of lighting type and direction on measurements o...
The results of surface texture measurements obtained with the stylus equipment, white light interfer...
Optical scanning systems are widely used for precision surface measurements because they offer incre...
In a recent publication [3rd International Conference on Surface Metrology, Annecy, France, 2012, p....
Optical instruments for areal surface topography measurement have seen significant commercial develo...
Focus Variation (FV) has been successfully employed for the three-dimensional measurement of rough s...
Optical profilometers can in principle be used to measure the roughness of surfaces that are not acc...
Surface quality plays a vital role in controlling the function performance of the workpiece. With th...
Manufacturers nowadays have access to state-of-the-art areal surface topography measurement instrume...
The most common optical technologies for surface topography measurement are coherence scanning inter...
This work is focused on the issue of non-measured points – one of the most important problems in sur...
This dissertation investigates a method for extending the measurement range of an optical surface pr...
In coaxial illumination telecentric imaging optical systems such as microscopes and imaging cameras,...
Non-measured points (NMPs) are one of vital problems in optical measurement. The number and location...
Unlike the optical information taken from a single in-focus image of general optical microscopy, thr...
International audienceThe paper presents the impact of lighting type and direction on measurements o...
The results of surface texture measurements obtained with the stylus equipment, white light interfer...
Optical scanning systems are widely used for precision surface measurements because they offer incre...
In a recent publication [3rd International Conference on Surface Metrology, Annecy, France, 2012, p....
Optical instruments for areal surface topography measurement have seen significant commercial develo...
Focus Variation (FV) has been successfully employed for the three-dimensional measurement of rough s...
Optical profilometers can in principle be used to measure the roughness of surfaces that are not acc...
Surface quality plays a vital role in controlling the function performance of the workpiece. With th...
Manufacturers nowadays have access to state-of-the-art areal surface topography measurement instrume...
The most common optical technologies for surface topography measurement are coherence scanning inter...
This work is focused on the issue of non-measured points – one of the most important problems in sur...
This dissertation investigates a method for extending the measurement range of an optical surface pr...
In coaxial illumination telecentric imaging optical systems such as microscopes and imaging cameras,...
Non-measured points (NMPs) are one of vital problems in optical measurement. The number and location...
Unlike the optical information taken from a single in-focus image of general optical microscopy, thr...