Design and Characterization of High-Q SAW Resonators Based on the AlN/Sapphire Structure Intended for High-Temperature Wireless Sensor Applications

International audienceAluminium nitride piezoelectric thin films grown on sapphire are strong candidates for high-temperature surface acoustic wave (SAW) sensors, due to their thermal stability, large bandgap, high acoustic velocity and suitable electromechanical coupling. However, thin-film resonators need more design efforts than those based on bulk crystals, due to the usually limited thickness of the piezoelectric films, and to acoustic properties disparities between the latters and their host substrate. This work presents an optimization of AlN/Sapphire-based SAW resonators with high quality factors for high-temperature applications. It combines specifically grown, 3 µm-thick aluminium nitride films, with the use of aluminium electrodes for their low density and resistivity, as an alternative to heavier electrodes like Pt. These electrodes allow for much lower mechanical losses and higher quality factors, in spite of needing passivation for increased lifetime. A standard resonator design is first presented and used for preliminary tests, in order to monitor the AlN/Sapphire structure with unprotected aluminium electrodes, for temperatures up to 600°C. A quasi-synchronous, optimized design is then proposed for higher quality factors and wireless sensing compliance. The high temperature characterizations confirmed that much larger quality factors can be retrieved from this optimized design. The quasi-synchronous resonators proposed in this study remain well-tuned for temperatures up to 400°C, and show high quality factors, as high as 3400 at 400°C