Typescript (photocopy).A new experimental method has been developed for studying negative secondary ion (SI) emission from solid surfaces bombarded by polyatomic primary ions of 5 to 30 keV. The method is based on the time-of-flight (TOF) analysis of primary ions which are produced by either ²⁵²Cf fission fragment induced desorption or by extraction from a liquid metal ion source, and then accelerated into a field free region. The primary ions included organic monomer, dimer, and fragment ions of coronene and phenylalanine, (CsI)(subscript n) C⁵⁺ cluster ions, and Au(subscript n)⁺cluster ions. Secondary electrons, emitted from a target surface upon primary ion impact, are used to identify which primary ion has hit the surface. An event-by-e...
In secondary ion mass spectrometry (SIMS), the beneficial effect of cesium implantation or flooding ...
In secondary ion mass spectrometry (SIMS), the beneficial effect of cesium implantation or flooding ...
Recent progress in organic secondary ion mass spectrometry (SIMS) relied essentially on the developm...
Typescript (photocopy).A new experimental method has been developed for studying negative secondary ...
We have studied the negative secondary ion emission from solid organic targets bombarded by molecula...
We have performed the first comparative study of the effect of molecular ion bombardment on the yiel...
The emission yields of the secondary ions are measured by using a conventional time of flight (TOF) ...
The current limitation for SIMS analyses is insufficient secondary ion yields, due in part to the in...
CAS/BIAS NIMA Au-Si liquid metal ion source which produces Au$_n$ clusters over a large range of siz...
A sample for studying secondary ion emissions was made by pressing powders of carbon nanottibes with...
Experiments show that polyatomic projectiles have the potential to improve the sensitivity of organi...
The emission yields of H, H-2, H-3 and heavy ions from carbon nanotubes under bombardments of Si and...
Des agrégats polyatomiques et ions moléculaires ont été produits par désorption induite par des frag...
Typescript (photocopy).Coincidence counting has been combined with time-of-flight mass spectrometry ...
We report on the co-emission of secondary ions and electrons resulting from 15 keV C60+ and 30 keV C...
In secondary ion mass spectrometry (SIMS), the beneficial effect of cesium implantation or flooding ...
In secondary ion mass spectrometry (SIMS), the beneficial effect of cesium implantation or flooding ...
Recent progress in organic secondary ion mass spectrometry (SIMS) relied essentially on the developm...
Typescript (photocopy).A new experimental method has been developed for studying negative secondary ...
We have studied the negative secondary ion emission from solid organic targets bombarded by molecula...
We have performed the first comparative study of the effect of molecular ion bombardment on the yiel...
The emission yields of the secondary ions are measured by using a conventional time of flight (TOF) ...
The current limitation for SIMS analyses is insufficient secondary ion yields, due in part to the in...
CAS/BIAS NIMA Au-Si liquid metal ion source which produces Au$_n$ clusters over a large range of siz...
A sample for studying secondary ion emissions was made by pressing powders of carbon nanottibes with...
Experiments show that polyatomic projectiles have the potential to improve the sensitivity of organi...
The emission yields of H, H-2, H-3 and heavy ions from carbon nanotubes under bombardments of Si and...
Des agrégats polyatomiques et ions moléculaires ont été produits par désorption induite par des frag...
Typescript (photocopy).Coincidence counting has been combined with time-of-flight mass spectrometry ...
We report on the co-emission of secondary ions and electrons resulting from 15 keV C60+ and 30 keV C...
In secondary ion mass spectrometry (SIMS), the beneficial effect of cesium implantation or flooding ...
In secondary ion mass spectrometry (SIMS), the beneficial effect of cesium implantation or flooding ...
Recent progress in organic secondary ion mass spectrometry (SIMS) relied essentially on the developm...