Add to ORKGCall number: LD2668 .T4 EECE 1989 E73Master of ScienceElectrical and Computer Engineerin
A novel method to generate a complete list of faults and their corresponding test vectors for a gate...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Call number: LD2668 .T4 EECE 1988 N33Master of ScienceElectrical and Computer Engineerin
Causes and symptoms of logic faults in digital systems. Reliable performance of hardware has been a ...
This paper examines the behavior of digital logic families, specifically identifying the properties ...
The main object of this Professional Project was to establish a microcomputer based system which cou...
[[abstract]]In this paper, we introduce a method that uses the held programmable gate array (FPGA)-b...
Semiconductor technology has made significant progress in the past two decades. As a result, manufac...
Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...
109 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Fault collapsing, test genera...
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generat...
Researchers have proposed different methods for testing digital logic circuits. The need for testing...
This brief interactive activity, by Electromechanical Digital Library and Wisconsin Technical Colleg...
The modelling and testing of microelectronic circuits for different technologies are presented. Rapi...
Call number: LD2668 .T4 EECE 1989 E73Master of ScienceElectrical and Computer Engineerin
A novel method to generate a complete list of faults and their corresponding test vectors for a gate...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Call number: LD2668 .T4 EECE 1988 N33Master of ScienceElectrical and Computer Engineerin
Causes and symptoms of logic faults in digital systems. Reliable performance of hardware has been a ...
This paper examines the behavior of digital logic families, specifically identifying the properties ...
The main object of this Professional Project was to establish a microcomputer based system which cou...
[[abstract]]In this paper, we introduce a method that uses the held programmable gate array (FPGA)-b...
Semiconductor technology has made significant progress in the past two decades. As a result, manufac...
Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJoint Services Electr...
109 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Fault collapsing, test genera...
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generat...
Researchers have proposed different methods for testing digital logic circuits. The need for testing...
This brief interactive activity, by Electromechanical Digital Library and Wisconsin Technical Colleg...
The modelling and testing of microelectronic circuits for different technologies are presented. Rapi...
Call number: LD2668 .T4 EECE 1989 E73Master of ScienceElectrical and Computer Engineerin
A novel method to generate a complete list of faults and their corresponding test vectors for a gate...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...