As CMOS technology scales down, Process, Voltage, Temperature and Ageing (PVTA) variations have an increasing impact on the performance and power consumption of electronic devices. These issues may hold back the continuous improvement of these devices in the near future. There are several ways to face the variability problem: to increase the operating margins of maximum clock frequency, the implementation of lithographic friendly layout styles, and the last one and the focus of this thesis, to adapt the circuit to its actual manufacturing and environment conditions by tuning some of the adjustable parameters once the circuit has been manufactured. The main challenge of this thesis is to develop a low-area variability compensation mechanism ...
PhD ThesisParametric variability increasingly affects the performance of electronic circuits as t...
Increasing performance demands in integrated circuits, together with limited energy budgets, force I...
O impacto das variações de processo e desvios "intra-die" no fabrico de circuitos analógicos e de si...
As CMOS technology scales down, Process, Voltage, Temperature and Ageing (PVTA) variations have an i...
Parameter variations, which are increasing along with advances in process technologies, affect both...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
As CMOS technology scales, Process, Voltage and Temperature (PVT) variations have an increasing impa...
Increasing performance demands in advanced technology, together with limited energy budgets, force i...
Improvements in circuit manufacturing have allowed, along the years, increasingly complex designs. ...
Designing digital circuits for sub-100nm bulk CMOS technology faces many challenges in terms of Proc...
This research thesis aims to develop a system composed by a a CMOS power amplifier and built-in sens...
Concevoir un circuit numérique en technologie CMOS inferieur à 100nm se heurte à de multiples défis ...
With technology scaling, circuit performance has become more sensitive to various sources of variabi...
Dans le contexte du développement de systèmes embarqués alliant hautes performances et basse consomm...
Avec la miniaturisation toujours plus poussée des technologies CMOS, il devient de plus en plus diff...
PhD ThesisParametric variability increasingly affects the performance of electronic circuits as t...
Increasing performance demands in integrated circuits, together with limited energy budgets, force I...
O impacto das variações de processo e desvios "intra-die" no fabrico de circuitos analógicos e de si...
As CMOS technology scales down, Process, Voltage, Temperature and Ageing (PVTA) variations have an i...
Parameter variations, which are increasing along with advances in process technologies, affect both...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
As CMOS technology scales, Process, Voltage and Temperature (PVT) variations have an increasing impa...
Increasing performance demands in advanced technology, together with limited energy budgets, force i...
Improvements in circuit manufacturing have allowed, along the years, increasingly complex designs. ...
Designing digital circuits for sub-100nm bulk CMOS technology faces many challenges in terms of Proc...
This research thesis aims to develop a system composed by a a CMOS power amplifier and built-in sens...
Concevoir un circuit numérique en technologie CMOS inferieur à 100nm se heurte à de multiples défis ...
With technology scaling, circuit performance has become more sensitive to various sources of variabi...
Dans le contexte du développement de systèmes embarqués alliant hautes performances et basse consomm...
Avec la miniaturisation toujours plus poussée des technologies CMOS, il devient de plus en plus diff...
PhD ThesisParametric variability increasingly affects the performance of electronic circuits as t...
Increasing performance demands in integrated circuits, together with limited energy budgets, force I...
O impacto das variações de processo e desvios "intra-die" no fabrico de circuitos analógicos e de si...