Add to ORKG[[abstract]]LFSRs are widely used in Built-In Self-Test (BIST) environment. A multiphase technique proposed to reduce the data transitions (DTs) in both the LFSR and the circuit under test has been found to have some limitations. This paper discusses the development of a low-power multiphase clock generator and the employment of static demultiplexers. It also proposes a hybrid design to reduce the power
This paper discusses the generation Pseudo Random number generation using Low Power Linear Feedback ...
In recent designs of IC’s (Integrated Circuits) BIST (Built-In Self-Test) is becoming vital for memo...
Power dissipation is a challenging problem in current VLSI designs. In general the power consumption...
Abstract — In this paper, we present new architecture for LFSR with gated clock technique which redu...
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce aver...
Abstract—A low-transition test pattern generator, called the low-transition linear feedback shift re...
Low power design techniques have been employed for more than two decades, however an emerging proble...
Abstract:-This paper presents a novel test pattern generator which is more suitable for built in sel...
Built in self testing (BIST) is most attractive technique to test different kind of circuits. In BIS...
In recent years, with the advance of digital Very Large Scale Integrated (VLSI) circuits, manufactur...
Mixed-mode BIST offers complete fault coverage with short test application times and small test data...
This paper considers the problem of minimizing the power required to test a BIST based combinational...
One of the important block of BIST controller is LFSR and the speed with which BIST operates depends...
A generic built-in self-test needed for SoC devices implementing for low power consumption. In this ...
Wasteful patterns that don't lead to fault dropping squander a tone of energy in the linear-feedback...
This paper discusses the generation Pseudo Random number generation using Low Power Linear Feedback ...
In recent designs of IC’s (Integrated Circuits) BIST (Built-In Self-Test) is becoming vital for memo...
Power dissipation is a challenging problem in current VLSI designs. In general the power consumption...
Abstract — In this paper, we present new architecture for LFSR with gated clock technique which redu...
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce aver...
Abstract—A low-transition test pattern generator, called the low-transition linear feedback shift re...
Low power design techniques have been employed for more than two decades, however an emerging proble...
Abstract:-This paper presents a novel test pattern generator which is more suitable for built in sel...
Built in self testing (BIST) is most attractive technique to test different kind of circuits. In BIS...
In recent years, with the advance of digital Very Large Scale Integrated (VLSI) circuits, manufactur...
Mixed-mode BIST offers complete fault coverage with short test application times and small test data...
This paper considers the problem of minimizing the power required to test a BIST based combinational...
One of the important block of BIST controller is LFSR and the speed with which BIST operates depends...
A generic built-in self-test needed for SoC devices implementing for low power consumption. In this ...
Wasteful patterns that don't lead to fault dropping squander a tone of energy in the linear-feedback...
This paper discusses the generation Pseudo Random number generation using Low Power Linear Feedback ...
In recent designs of IC’s (Integrated Circuits) BIST (Built-In Self-Test) is becoming vital for memo...
Power dissipation is a challenging problem in current VLSI designs. In general the power consumption...