We observe a rapid temperature variation and an electric field dependence of the d.c. conductivity in a carefully characterized sample of P doped Si. These results, combined with measurements of Raman scattering, far-infrared absorption and magnetic susceptibility, indicate a large characteristic electronic length (10^4 times the donor Bohr radius) at a donor concentration just below the critical density of the metal-insulator transition
For nondegenerate bulk semiconductors, we have used the virial theorem to derive an expression for t...
We investigate the transport properties of -type noncompensated silicon below the insulator-metal tr...
We present results of 1/f noise measurements at low frequency (10(-3) < f < 10 Hz) and at low temper...
We observe a rapid temperature variation and an electric field dependence of the d.c. conductivity i...
High-resolution measurements of the electrical conductivity $\sigma (T)$ below $T= 1\,{\rm K}$ of un...
Millikelvin measurements of the conductivity as a function of donor density and uniaxial stress in b...
We have measured the resistivity rho of a dilute two- dimensional electron gas near the (111) silic...
The zero-temperature conductivity of Si:B with dopant concentrations near the metal-insulator transi...
We have studied the temperature dependence of resistivity, \u3c1, for a two-dimensional electron sys...
Zero-temperature metallic conductivities have been measured above and below Mott's minimum value σ_(...
We observe a maximum near 200 K in the zero frequency resistivity of Si:P doped et about twice the ...
We have performed longitudinal magnetoresistance measurements on heavily n-doped silicon for donor c...
p. 6551-6553In light of a recent investigation of the conductivity and metal-insulator transition in...
We present measurements of the electrical conductivity at low temperatures of bulk samples of Si:P u...
We have measured the real and imaginary parts of the dielectric susceptibility of insulating samples...
For nondegenerate bulk semiconductors, we have used the virial theorem to derive an expression for t...
We investigate the transport properties of -type noncompensated silicon below the insulator-metal tr...
We present results of 1/f noise measurements at low frequency (10(-3) < f < 10 Hz) and at low temper...
We observe a rapid temperature variation and an electric field dependence of the d.c. conductivity i...
High-resolution measurements of the electrical conductivity $\sigma (T)$ below $T= 1\,{\rm K}$ of un...
Millikelvin measurements of the conductivity as a function of donor density and uniaxial stress in b...
We have measured the resistivity rho of a dilute two- dimensional electron gas near the (111) silic...
The zero-temperature conductivity of Si:B with dopant concentrations near the metal-insulator transi...
We have studied the temperature dependence of resistivity, \u3c1, for a two-dimensional electron sys...
Zero-temperature metallic conductivities have been measured above and below Mott's minimum value σ_(...
We observe a maximum near 200 K in the zero frequency resistivity of Si:P doped et about twice the ...
We have performed longitudinal magnetoresistance measurements on heavily n-doped silicon for donor c...
p. 6551-6553In light of a recent investigation of the conductivity and metal-insulator transition in...
We present measurements of the electrical conductivity at low temperatures of bulk samples of Si:P u...
We have measured the real and imaginary parts of the dielectric susceptibility of insulating samples...
For nondegenerate bulk semiconductors, we have used the virial theorem to derive an expression for t...
We investigate the transport properties of -type noncompensated silicon below the insulator-metal tr...
We present results of 1/f noise measurements at low frequency (10(-3) < f < 10 Hz) and at low temper...