Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs
- Clemente Barreira, Juan Antonio
- Franco Peláez, Francisco Javier
- Villa, Francesca
- Rey, Sole
- Baylac, Maud
- Mecha López, Hortensia
- Agapito Serrano, Juan Andrés
- Puchner, Helmut
- Hubert, Guillaume
- Velazco, Raoul
Publication date
September 2015
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
This paper presents an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented
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