Laser induced single events in SRAMs
- Palomar Trives, Carlos
- López Calle, Isabel
- Franco Peláez, Francisco Javier
- Agapito Serrano, Juan Andrés
- González Izquierdo, Jesús
Publication date
February 2013
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur
Add to ORKG