This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible
21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)...
This paper presents a single event upset (SEU) sensitivity characterization at ultralow bias voltage...
Space radiation is a harsh environment affecting all electronic devices used on spacecraft, despite ...
International audienceThis paper describes a field test system to evaluate the sensitivity of SRAMs ...
Static Random Access Memories (SRAMs) are important storage components and widely used in digital sy...
Electronic systems in space and terrestrial environments are subjected to a flow of particles of nat...
International audienceIntegrated circuits are sensitive to the effects of natural radiation. This pa...
Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desig...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
This paper presents the characterization of the sensitivity to 14-MeV neutrons of a Commercial Off-T...
ISBN :978-1-4419-6922-7Integrated circuits (analog, digital or mixed) sensitivity evaluation to Sing...
With the rise of the transistor in the 1970s, electronics shifted from analog circuitry, where value...
RazakSat1 was launched at Near Equatorial Orbit (NEqO) where Trapped Protons/Electrons (TP/TE) and G...
An embedded system for SEU(single event upset) test needs to be designed to prevent system failure b...
This article presents an experimental study on the sensitivity of a commercial-off-the-shelf (COTS) ...
21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)...
This paper presents a single event upset (SEU) sensitivity characterization at ultralow bias voltage...
Space radiation is a harsh environment affecting all electronic devices used on spacecraft, despite ...
International audienceThis paper describes a field test system to evaluate the sensitivity of SRAMs ...
Static Random Access Memories (SRAMs) are important storage components and widely used in digital sy...
Electronic systems in space and terrestrial environments are subjected to a flow of particles of nat...
International audienceIntegrated circuits are sensitive to the effects of natural radiation. This pa...
Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desig...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
This paper presents the characterization of the sensitivity to 14-MeV neutrons of a Commercial Off-T...
ISBN :978-1-4419-6922-7Integrated circuits (analog, digital or mixed) sensitivity evaluation to Sing...
With the rise of the transistor in the 1970s, electronics shifted from analog circuitry, where value...
RazakSat1 was launched at Near Equatorial Orbit (NEqO) where Trapped Protons/Electrons (TP/TE) and G...
An embedded system for SEU(single event upset) test needs to be designed to prevent system failure b...
This article presents an experimental study on the sensitivity of a commercial-off-the-shelf (COTS) ...
21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)...
This paper presents a single event upset (SEU) sensitivity characterization at ultralow bias voltage...
Space radiation is a harsh environment affecting all electronic devices used on spacecraft, despite ...