Empirical Mathematical Model of Microprocessor Sensitivity and Early Prediction to Proton and Neutron Radiation-Induced Soft Errors

A mathematical model is described to predict microprocessor fault tolerance under radiation. The model is empirically trained by combining data from simulated fault-injection campaigns and radiation experiments, both with protons (at the National Center of Accelerators (CNA) facilities, Seville, Spain) and neutrons [at the Los Alamos Neutron Science Center (LANSCE) Weapons Neutron Research Facility at Los Alamos, USA]. The sensitivity to soft errors of different blocks of commercial processors is identified to estimate the reliability of a set of programs that had previously been optimized, hardened, or both. The results showed a standard error under 0.1, in the case of the Advanced RISC Machines (ARM) processor, and 0.12, in the case of the MSP430 microcontroller.This work was supported in part by Spanish MINECO under Project ESP-2015-68245-C4-3-P and Project ESP-2015-68245-C4-4-P