Large-signal performance of GaAs based pHEMT devices were investigated using a combination of analytical models and measured data from a novel, time-domain active load-pull measurement system. A method for developing large-signal circuits from a collection of small-signal circuits was implemented using a nonlinear least-squares fitting technique. Small-signal circuits were extracted using a combination of coldFET and hotFET techniques with a new modification that more accurately models the bonding pad capacitance on the drain side of the device. Five common large-signal models used in the study. The novel, time-domain measurement system simultaneously measures data at the fundamental and harmonic frequencies. New vector error correcti...
none8Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of “trap...
We describe a measurement system for model parameter extraction and full characterization of power t...
In this letter we extract the parameters of the charge equations of a microwave transistor nonlinear...
Nonlinear models of microwave transistors are essential for the design of high-frequency nonlinear c...
none6A recently proposed, technology-independent model is adopted for small- and large-signal perfo...
Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of "traps" (i...
In recent years there has been tremendous progress in the development of high-bandwidth semiconducto...
International audienceA new time-domain waveform measurement system based on the combination of an h...
This paper outlines a non-linear measurement approach suitable for wafer mapping and technology scre...
A recently proposed, technology-independent model is adopted for small- and large-signal performance...
Large-signal dynamic modelling of III-V FETs cannot be simply based on dc i/v characteristics, when ...
International audienceOne of the most important requirements that RF and microwave power amplifiers ...
We describe a measurement system for model parameter extraction and full characterization of power t...
Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of "traps" (i...
© 1963-2012 IEEE. In the paper, the nonlinear model of a microwave transistor is extracted from larg...
none8Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of “trap...
We describe a measurement system for model parameter extraction and full characterization of power t...
In this letter we extract the parameters of the charge equations of a microwave transistor nonlinear...
Nonlinear models of microwave transistors are essential for the design of high-frequency nonlinear c...
none6A recently proposed, technology-independent model is adopted for small- and large-signal perfo...
Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of "traps" (i...
In recent years there has been tremendous progress in the development of high-bandwidth semiconducto...
International audienceA new time-domain waveform measurement system based on the combination of an h...
This paper outlines a non-linear measurement approach suitable for wafer mapping and technology scre...
A recently proposed, technology-independent model is adopted for small- and large-signal performance...
Large-signal dynamic modelling of III-V FETs cannot be simply based on dc i/v characteristics, when ...
International audienceOne of the most important requirements that RF and microwave power amplifiers ...
We describe a measurement system for model parameter extraction and full characterization of power t...
Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of "traps" (i...
© 1963-2012 IEEE. In the paper, the nonlinear model of a microwave transistor is extracted from larg...
none8Low-frequency (LF) dispersive phenomena due to device self-heating and/or the presence of “trap...
We describe a measurement system for model parameter extraction and full characterization of power t...
In this letter we extract the parameters of the charge equations of a microwave transistor nonlinear...