A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks

The IEEE 1687 standard introduces several novelties, most notably Reconfigurable Scan Networks (RSNs), i.e., scan chains whose length can change dynamically. These architectures offer important advantages but can result in extremely complex integrity test following traditional structural approaches. In this paper, we will present an innovative approach to RSN test and debug based on the functional features of the standard, which is able to greatly speed up test generation time while guaranteeing a precise fault coverage