The performance and reliability of Ultra-Low-Power (ULP) computing platforms are adversely affected by environmental temperature and process variations. Mitigating the effect of these phenomena becomes crucial when these devices operate near-threshold, due to the magnification of process variations and to the strong temperature inversion effect that affects advanced technology nodes in low-voltage corners, which causes huge overhead due to margining for timing closure. Supporting an extended range of reverse and forward body-bias, UTBB FD-SOI technology provides a powerful knob to compensate for such variations. In this work we propose a methodology to maximize energy efficiency at run-time exploiting body biasing on a ULP platform operatin...
Preventing device obsolescence in Internet-ofthings (IoT) is mandatory for its massive deployment to...
Abstract—In this study, we explore the design of a subthreshold processor for use in ultra-low-energ...
Temperature dependent propagation delay characteristics of CMOS circuits will experience a complete ...
The performance and reliability of Ultra-Low-Power (ULP) computing platforms are adversely affected ...
Environmental temperature variations, as well as process variations, have a detrimental effect on pe...
none5siAdvanced Ultra-Low Power (ULP) computing platforms can be affected by large performance varia...
Ultra-low power operation and extreme energy efficiency are strong requirements for a number of high...
none5siEnergy efficiency is a crucial aspect in modern SoCs. Common strategies like aggressive volta...
partially_open7siNome progetto: MultithermanA 4-core cluster fabricated in low power 28nm UTBB FD-SO...
As technology scales down in order to meet demands of more computing power per area, a variety of ch...
We present a low-power, energy efficient 32-bit RISC-V microprocessor unit (MCU) in 22 nm FD-SOI. It...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse...
Near Threshold Operation is today a key research area in ultra-low power (ULP) computing, as it prom...
Process and environmental temperature variations have a detrimental effect on performance and reliab...
This paper demonstrates a wide supply range multiply-accumulate datapath block in 28nm UTBB FD-SOI t...
Preventing device obsolescence in Internet-ofthings (IoT) is mandatory for its massive deployment to...
Abstract—In this study, we explore the design of a subthreshold processor for use in ultra-low-energ...
Temperature dependent propagation delay characteristics of CMOS circuits will experience a complete ...
The performance and reliability of Ultra-Low-Power (ULP) computing platforms are adversely affected ...
Environmental temperature variations, as well as process variations, have a detrimental effect on pe...
none5siAdvanced Ultra-Low Power (ULP) computing platforms can be affected by large performance varia...
Ultra-low power operation and extreme energy efficiency are strong requirements for a number of high...
none5siEnergy efficiency is a crucial aspect in modern SoCs. Common strategies like aggressive volta...
partially_open7siNome progetto: MultithermanA 4-core cluster fabricated in low power 28nm UTBB FD-SO...
As technology scales down in order to meet demands of more computing power per area, a variety of ch...
We present a low-power, energy efficient 32-bit RISC-V microprocessor unit (MCU) in 22 nm FD-SOI. It...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse...
Near Threshold Operation is today a key research area in ultra-low power (ULP) computing, as it prom...
Process and environmental temperature variations have a detrimental effect on performance and reliab...
This paper demonstrates a wide supply range multiply-accumulate datapath block in 28nm UTBB FD-SOI t...
Preventing device obsolescence in Internet-ofthings (IoT) is mandatory for its massive deployment to...
Abstract—In this study, we explore the design of a subthreshold processor for use in ultra-low-energ...
Temperature dependent propagation delay characteristics of CMOS circuits will experience a complete ...