We investigate the dependency of electrostatic interaction forces on applied potentials in electrostatic force microscopy (EFM) as well as in related local potentiometry techniques such as Kelvin probe microscopy (KPM). The approximated expression of electrostatic interaction between two conductors, usually employed in EFM and KPM, may loose its validity when probe-sample distance is not very small, as often realized when realistic nanostructured systems with complex topography are investigated. In such conditions, electrostatic interaction does not depend solely on the potential difference between probe and sample, but instead it may depend on the bias applied to each conductor. For instance, electrostatic force can change from repulsive t...
Nanotechnology Electrostatic interaction in scanning probe microscopy when imaging in electrolyte so...
For the past decades, Kelvin probe force microscopy (KPFM) developed from a sidebranch of atomic for...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
The study of a surface\u2019s electrical properties at very small scales with scanning probe microsc...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
Nanotriboelectrification is studied by a Kelvin probe force microscopy (KFM)-based method. The elect...
It is difficult to imagine a more flexible platform for nanoscale instrumentation design than the mo...
In this study we investigate the influence of the operation method in Kelvin probe force microscopy ...
Electrostatic force microscopy has been used to study the electrostatic force on a nanometer length ...
The Atomic Force Microscope used in resonant mode is a powerful tool to measure local surface proper...
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force mic...
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials ...
The Atomic Force Microscope used in resonant mode is a powerful tool to measure local surface proper...
A simple analytical model describing tip-surface interactions in an electrostatic force microscopy (...
Nanotechnology Electrostatic interaction in scanning probe microscopy when imaging in electrolyte so...
For the past decades, Kelvin probe force microscopy (KPFM) developed from a sidebranch of atomic for...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
The study of a surface\u2019s electrical properties at very small scales with scanning probe microsc...
The study of a surface’s electrical properties at very small scales with scanning probe microscopy i...
Nanotriboelectrification is studied by a Kelvin probe force microscopy (KFM)-based method. The elect...
It is difficult to imagine a more flexible platform for nanoscale instrumentation design than the mo...
In this study we investigate the influence of the operation method in Kelvin probe force microscopy ...
Electrostatic force microscopy has been used to study the electrostatic force on a nanometer length ...
The Atomic Force Microscope used in resonant mode is a powerful tool to measure local surface proper...
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force mic...
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials ...
The Atomic Force Microscope used in resonant mode is a powerful tool to measure local surface proper...
A simple analytical model describing tip-surface interactions in an electrostatic force microscopy (...
Nanotechnology Electrostatic interaction in scanning probe microscopy when imaging in electrolyte so...
For the past decades, Kelvin probe force microscopy (KPFM) developed from a sidebranch of atomic for...
The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) te...