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Scanning electron microscopy and x-ray microanalysis

Goldstein, Joseph I.
Newbury, Dale E.
MIchael, Joseph R.
Ritchie, Nicholas W.M.
Scott, John Henry J.
Joy, David C.

Publication date

January 2018

Publisher

Springer Fachmedien Wiesbaden GmbH

Abstract

e-Book available, please log-in on Member Area to access or contact our librarian.xxiii, 550 p

Extracted data

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