Abstract A highly reliable three-dimensional network structure joint was fabricated based on Cu/Ni/Sn powder with double-layer coatings and transient liquid phase bonding (TLPB) technology for high temperature application. The Cu/Ni/Sn joint is characterized by Cu metal particles embedded in the matrix of (Cu,Ni)6Sn5/Ni3Sn4 intermetallic compounds (IMCs), with a low void ratio, and can be reflowed at low temperatures (<260°C), but it can reliably work at a high temperature up to 415°C. Cu/Ni/Sn double-layer powders with different Sn layer and Ni layer thickness were was fabricated and compressed as preform used for TLPB joint bonding. The microstructure and phase composition evolution for Cu/Sn and Cu/Ni/Sn systems dur...
This study explored the possibility of employing a bi-layer barrier of electroless-plated Ni(P)/thin...
[[abstract]]Cu/electroless Ni/immersion Au metallization is usually used as bonding pad on the subst...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 20...
Joining based on transient liquid phase bonding (TLPB) has a great prospect in microelectronic pac...
Transient liquid phase bonding (TLPB) is a promising technology for three-dimensional integration of...
Sn based composite solder, reinforced with low porosity Ni-foam, was used to fabricate high melting ...
Developing solder joints capable of withstanding high power density, high temperature, and significa...
With growing demand in electronic system for operating in harsh conditions makes the idea of researc...
Developing solder joints capable of withstanding high power density, high temperature, and significa...
To develop new electronic packaging techniques for harsh environments, the microstructure and associ...
This study focuses on the mechanism of phase transformation from Cu6Sn5 into Cu3Sn and the homogeniz...
This study focuses on the microstructural evolution process of Cu–Sn–Ni intermetallic compounds (IMC...
AbstractInterfacial reactions of the Ni/AuSn/Ni and Cu/AuSn/Ni joints are experimentally studied at ...
CuSn is the most common intermetallic compound (IMC) in lead-free solder joints, and is also a promi...
The Sn4.7Ag1.7Cu+Ag composite solder/Cu joint was prepared with Sn4.7Ag1.7Cu+Ag composite solder by ...
This study explored the possibility of employing a bi-layer barrier of electroless-plated Ni(P)/thin...
[[abstract]]Cu/electroless Ni/immersion Au metallization is usually used as bonding pad on the subst...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 20...
Joining based on transient liquid phase bonding (TLPB) has a great prospect in microelectronic pac...
Transient liquid phase bonding (TLPB) is a promising technology for three-dimensional integration of...
Sn based composite solder, reinforced with low porosity Ni-foam, was used to fabricate high melting ...
Developing solder joints capable of withstanding high power density, high temperature, and significa...
With growing demand in electronic system for operating in harsh conditions makes the idea of researc...
Developing solder joints capable of withstanding high power density, high temperature, and significa...
To develop new electronic packaging techniques for harsh environments, the microstructure and associ...
This study focuses on the mechanism of phase transformation from Cu6Sn5 into Cu3Sn and the homogeniz...
This study focuses on the microstructural evolution process of Cu–Sn–Ni intermetallic compounds (IMC...
AbstractInterfacial reactions of the Ni/AuSn/Ni and Cu/AuSn/Ni joints are experimentally studied at ...
CuSn is the most common intermetallic compound (IMC) in lead-free solder joints, and is also a promi...
The Sn4.7Ag1.7Cu+Ag composite solder/Cu joint was prepared with Sn4.7Ag1.7Cu+Ag composite solder by ...
This study explored the possibility of employing a bi-layer barrier of electroless-plated Ni(P)/thin...
[[abstract]]Cu/electroless Ni/immersion Au metallization is usually used as bonding pad on the subst...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 20...