Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elemental composition and bonding environments. However in practice, the complexity of the background contributions, which can arise from multiple sources, can hamper the interpretation of the spectra. As a result, background removal is both an essential and difficult part of EELS analysis, especially during quantification of elemental composition. Typically, a power law is used to fit the background but this is often not suitable for many spectra such as in the low-loss region (< 50 eV) and when there are overlapping EELS edges. In this article, we present a series of scripts written in MATLAB v. R2019b that aims to provide statistical information o...
An extension to model based electron energy loss spectroscopy (EELS) quantifi-cation is reported to ...
Acquisition of a great number of energy-filtered images in a TEM (EFTEM) around the characteristic s...
Acquisition of a great number of energy-filtered images in a TEM (EFTEM) around the characteristic s...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
At large scattering angle the background formation in electron-energy-loss spectroscopy is determine...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
Compton scattering in electron energy loss spectroscopy (EELS) is used to quantify the momentum dist...
peer reviewedElectron energy loss spectroscopy (EELS) is a technique to investigate the physical pro...
Electron energy loss spectroscopy (EELS) is a technique to investigate the physical properties of ma...
Abstract. Electron energy loss spectroscopy (EELS) is an ideal tool to obtain chemical information f...
Electron energy-loss spectroscopy (EELS) is an analytical microscopy technique which measures the en...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B. V. in Ultramicro...
In this thesis, a comprehensive automated quantification process of some of the features in electron...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
An extension to model based electron energy loss spectroscopy (EELS) quantifi-cation is reported to ...
Acquisition of a great number of energy-filtered images in a TEM (EFTEM) around the characteristic s...
Acquisition of a great number of energy-filtered images in a TEM (EFTEM) around the characteristic s...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
Electron energy-loss spectroscopy (EELS) is a technique that can give useful information on elementa...
At large scattering angle the background formation in electron-energy-loss spectroscopy is determine...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
Compton scattering in electron energy loss spectroscopy (EELS) is used to quantify the momentum dist...
peer reviewedElectron energy loss spectroscopy (EELS) is a technique to investigate the physical pro...
Electron energy loss spectroscopy (EELS) is a technique to investigate the physical properties of ma...
Abstract. Electron energy loss spectroscopy (EELS) is an ideal tool to obtain chemical information f...
Electron energy-loss spectroscopy (EELS) is an analytical microscopy technique which measures the en...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B. V. in Ultramicro...
In this thesis, a comprehensive automated quantification process of some of the features in electron...
This is an AAM - Author Accepted Manuscript of the article published by Elsevier B.V. in Ultramicros...
An extension to model based electron energy loss spectroscopy (EELS) quantifi-cation is reported to ...
Acquisition of a great number of energy-filtered images in a TEM (EFTEM) around the characteristic s...
Acquisition of a great number of energy-filtered images in a TEM (EFTEM) around the characteristic s...